Programmable integrated circuit having built in test circuit
    1.
    发明授权
    Programmable integrated circuit having built in test circuit 有权
    内置测试电路的可编程集成电路

    公开(公告)号:US07786749B1

    公开(公告)日:2010-08-31

    申请号:US12468762

    申请日:2009-05-19

    摘要: A programmable integrated circuit has a plurality of logic elements with each logic element having a plurality of input leads and at least one output lead. The programmable integrated circuit further comprises a group of interconnect lines, and a first set of programmable circuits for electrically connecting the input and output leads of the plurality of logic elements to each other through the group of interconnect lines. The programmable integrated circuit further comprises a test circuit having at least one input and one output. Further the programmable integrated circuit comprises a second set of programmable circuits for electrically connecting the one output of the test circuit to the plurality of input leads of each of the plurality of logic elements and for electrically connecting the at least one output lead of each of the plurality of logic elements to the one input of the test circuit, through the group of interconnect lines.

    摘要翻译: 可编程集成电路具有多个逻辑元件,每个逻辑元件具有多个输入引线和至少一个输出引线。 可编程集成电路还包括一组互连线,以及第一组可编程电路,用于通过该组互连线将多个逻辑元件的输入和输出引线彼此电连接。 可编程集成电路还包括具有至少一个输入和一个输出的测试电路。 此外,可编程集成电路包括第二组可编程电路,用于将测试电路的一个输出电连接到多个逻辑元件中的每一个的多个输入引线,并且用于将每个的每个的至少一个输出引线电连接 多个逻辑元件连接到测试电路的一个输入端,通过一组互连线。