摘要:
A method of making a backside illuminated sensor is provided. A substrate is provided and a high energy ion implantation is performed over the substrate to implant a first doped region. A layer is formed over the substrate and a self-align high energy ion implantation is performed over the substrate to implant a second doped region over the first doped region. The combined thickness of the first and second doped region is greater than 50 percent of thickness of the substrate and the distance between back surface of the substrate and the first and second doped regions is less than 50 percent of thickness of the substrate. In this way, an enlarged light sensing region is formed through which electrons generated from back surface of the surface may easily reach the pixel.
摘要:
The present disclosure provides a backside illuminated semiconductor device. The device includes a semiconductor substrate having a front surface and a back surface, a sensor element formed on the front surface of the semiconductor substrate, and a light reflective layer (LRL) disposed over the sensor element. The LRL is configured to reflect light directed towards the back surface and through the sensor element.
摘要:
A method for improving sensitivity of backside illuminated image sensor. A substrate having a first conductivity type and a first potential. A depletion region having a second conductivity type is formed within the substrate. The depletion region is extended. The thickness of the substrate is reduced. First type conductivity ions having a second potential are implanted at backside surface of the substrate to form a doping layer. Laser annealing on the doping layer is performed to activate the first type conductivity ions.