公开(公告)号：US20230020783A1

公开(公告)日：2023-01-19

申请号：US17406084

申请日：2021-08-19

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Po-Wei Tsou ,  Chang-Ting Lo

IPC: G01R31/3185 ,  G01R31/319

Abstract: A testkey includes two switching circuits and two compensation circuits. The first switching circuit transmits a test signal to a first DUT when the first DUT is being tested and functions as high impedance when the first DUT is not being tested. The second switching circuit transmits the test signal to a second DUT when the second DUT is being tested and functions as high impedance when the second DUT is not being tested. When the first DUT is not being tested and the second DUT is being tested, the first compensation circuit provides first compensation current for reducing the leakage current of the first switching circuit. When the first DUT is being tested and the second DUT is not being tested, the second compensation circuit provides second compensation current for reducing the leakage current of the second switching circuit.

公开(公告)号：US11614486B2

公开(公告)日：2023-03-28

申请号：US17406084

申请日：2021-08-19

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Po-Wei Tsou ,  Chang-Ting Lo

IPC: G01R31/3185 ,  G01R31/319 ,  G01R22/00

Abstract: A testkey includes two switching circuits and two compensation circuits. The first switching circuit transmits a test signal to a first DUT when the first DUT is being tested and functions as high impedance when the first DUT is not being tested. The second switching circuit transmits the test signal to a second DUT when the second DUT is being tested and functions as high impedance when the second DUT is not being tested. When the first DUT is not being tested and the second DUT is being tested, the first compensation circuit provides first compensation current for reducing the leakage current of the first switching circuit. When the first DUT is being tested and the second DUT is not being tested, the second compensation circuit provides second compensation current for reducing the leakage current of the second switching circuit.

公开(公告)号：US09939463B2

公开(公告)日：2018-04-10

申请号：US15092586

申请日：2016-04-06

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Po-Wei Tsou

IPC: G01R1/20 ,  G01R31/26

CPC classification number: G01R1/206 ,  G01R31/2639

Abstract: A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.

公开(公告)号：US20170292976A1

公开(公告)日：2017-10-12

申请号：US15092586

申请日：2016-04-06

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Po-Wei Tsou

IPC: G01R1/20 ,  G01R31/26

CPC classification number: G01R1/206 ,  G01R31/2639

Abstract: A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.