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公开(公告)号:US20240413136A1
公开(公告)日:2024-12-12
申请号:US18223539
申请日:2023-07-18
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Tsung-Kai Yu , Chen-Hsiao Wang , Yi-Feng Hsu , Kai-Kuang Ho
IPC: H01L25/10 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/522
Abstract: The present invention provides a 3D integrated circuit structure formed by stacking semiconductor structures. The semiconductor structures form a multi-die heterogeneous 3D packaging by direct bonding the bonding pads of re-distribution layers. The same or different dies are used to produce the semiconductor structures through the back-end packaging process, and then hybrid bonding technology is used to stack and interconnect the semiconductor structures. The position of the bonding pad can be redefined by re-distribution layer, thereby overcoming the limitations of chip bonding pad position, chip size and quantity.
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公开(公告)号:US11495510B2
公开(公告)日:2022-11-08
申请号:US16780639
申请日:2020-02-03
Applicant: United Microelectronics Corp.
Inventor: Yu-Yuan Huang , Tsung-Kai Yu , Chen-Hsiao Wang , Kai-Kuang Ho , Kuang-Hui Tang
Abstract: A semiconductor device package structure includes a substrate. The substrate has a circuit structure formed in a die region. The die region is defined by a plurality of scribe lines configured on the substrate. A seal ring is disposed in the substrate and located at a periphery region of the die region, and surrounds at least a portion of the circuit structure. A trench ring is disposed in the substrate between the seal ring and the scribe lines. A packaging passivation cap layer covers over the circuit structure and the seal ring, and covers at least the trench ring.
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公开(公告)号:US20210202340A1
公开(公告)日:2021-07-01
申请号:US16780639
申请日:2020-02-03
Applicant: United Microelectronics Corp.
Inventor: YU-YUAN HUANG , Tsung-Kai Yu , Chen-Hsiao Wang , Kai-Kuang Ho , Kuang-Hui Tang
Abstract: A semiconductor device package structure includes a substrate. The substrate has a circuit structure formed in a die region. The die region is defined by a plurality of scribe lines configured on the substrate. A seal ring is disposed in the substrate and located at a periphery region of the die region, and surrounds at least a portion of the circuit structure. A trench ring is disposed in the substrate between the seal ring and the scribe lines. A packaging passivation cap layer covers over the circuit structure and the seal ring, and covers at least the trench ring.
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