公开(公告)号：US20160245767A1

公开(公告)日：2016-08-25

申请号：US15027827

申请日：2014-09-26

Applicant: UNITED TECHNOLOGIES CORPORATION

Inventor： Michael J. BIRNKRANT ,  Wayde R. SCHMIDT

IPC: G01N27/04 ,  F01D25/00 ,  F01D5/28 ,  G01N21/66

CPC classification number: G01N27/04 ,  F01D5/282 ,  F01D25/005 ,  F05D2300/5023 ,  F05D2300/6033 ,  G01N21/66 ,  G01N21/84 ,  G01N33/388 ,  G01N2021/8472

Abstract: A method of detecting conversion quality includes the steps of providing an article having a green material and a semiconductor material, processing the green material and the semiconductor material to produce a matrix composite, and detecting a matrix composite conversion quality with the semiconductor material.

Abstract translation: 检测转换质量的方法包括提供具有生坯材料和半导体材料的制品，处理生坯材料和半导体材料以产生基质复合材料的步骤，以及用半导体材料检测基体复合转化质量的步骤。