PHOTONIC CHIP AND METHOD OF MANUFACTURE

    公开(公告)号:US20220214498A1

    公开(公告)日:2022-07-07

    申请号:US17605500

    申请日:2020-04-24

    Abstract: The invention provides a photonic chip comprising: a silicon substrate, an low refractive index layer above the silicon substrate, and a tapered waveguide above the low refractive index layer, the tapered waveguide having a first height at a first end of the tapered waveguide and a second height at a second end of the tapered waveguide, the second height being greater than the first height, and the tapered waveguide having a bottom surface that is closer to the substrate at the second end than at the first end. The invention further provides a method of manufacturing a photonic chip, the method comprising: providing a wafer comprising a silicon substrate, and an low refractive index layer above the silicon substrate, etching the low refractive index layer to form a tapered trench having a first height at a first end of the tapered trench and a second height at a second end of the tapered trench, the first second height being greater than the second first height, and the tapered trench having a bottom surface that is closer to the substrate at the first second end than at the second first end, and forming a tapered waveguide in the tapered trench.

    OPTICAL STRUCTURE AND METHOD OF FABRICATING AN OPTICAL STRUCTUR

    公开(公告)号:US20190250434A1

    公开(公告)日:2019-08-15

    申请号:US16324748

    申请日:2017-08-09

    CPC classification number: G02F1/025 G02F2001/0152 G02F2201/063 G02F2202/105

    Abstract: A method of fabricating an optical structure comprises providing a layer of single crystal crystalline silicon supported on an insulating surface of a silicon substrate; using etching to remove part of the silicon layer and define a side wall which is non-parallel to the insulating surface of the substrate; forming a layer of insulating material over the side wall; forming a further layer of silicon over at least the insulating material; and removing the silicon of the further layer to a level of the layer of silicon such that the layer of insulating material occupies a slot between a portion of silicon in the layer and a portion of silicon in the further layer, a thickness of the layer of insulating material defining a width of the slot.

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