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    Method and device for determining the thickness of material using high frequency
    3.
    发明申请
    Method and device for determining the thickness of material using high frequency 有权
    使用高频确定材料厚度的方法和装置

    公开(公告)号：US20070188169A1

    公开(公告)日：2007-08-16

    申请号：US10588183

    申请日：2005-06-09

    申请人： Michael Mahler ,  Ulli Hoffmann ,  Reiner Krapf ,  Christoph Wieland ,  Felix Wewers

    发明人： Michael Mahler ,  Ulli Hoffmann ,  Reiner Krapf ,  Christoph Wieland ,  Felix Wewers

    IPC分类号： G01B7/06

    CPC分类号： G01B7/10

    摘要： The present invention relates to a method for determining the thickness of material by penetrating the material, in particular a method for measuring the thickness of walls, ceilings and floors, with which a measurement signal (28) in the gigahertz frequency range emitted using a high-frequency transmitter (24) penetrates the material (10) to be investigated at least once and is detected by a high-frequency receiver (38). According to the present invention, it is provided that the thickness (d) of the material (10) is measured via at least two transit-time measurements of the measurement signal (28) performed at various positions (20, 22) of the high-frequency transmitter (24) and/or the high-frequency receiver (34). The present invention also relates to a device system (12; 40, 140, 240, 340) for carrying out the method described above.

    摘要翻译： 本发明涉及一种通过穿透材料来确定材料厚度的方法，特别是一种用于测量墙壁，天花板和地板的厚度的方法，利用该方法，使用高的数字发射千兆赫兹频率范围内的测量信号（28） - 频率发射器（24）至少一次穿透待研究的材料（10），并由高频接收器（38）检测。 根据本发明，通过在高位（20,22）的各个位置（20,22）处执行的测量信号（28）的至少两次渡越时间测量来测量材料（10）的厚度（d） 频率发射机（24）和/或高频接收机（34）。 本发明还涉及用于执行上述方法的装置系统（12; 40,140,​​240,340）。

    Method and device for determining the thickness of material using high frequency
    4.
    发明授权
    Method and device for determining the thickness of material using high frequency 有权
    使用高频确定材料厚度的方法和装置

    公开(公告)号：US08531329B2

    公开(公告)日：2013-09-10

    申请号：US10588183

    申请日：2005-06-09

    申请人： Michael Mahler ,  Ulli Hoffmann ,  Reiner Krapf ,  Christoph Wieland ,  Felix Wewers

    发明人： Michael Mahler ,  Ulli Hoffmann ,  Reiner Krapf ,  Christoph Wieland ,  Felix Wewers

    IPC分类号： G01S13/75

    CPC分类号： G01B7/10

    摘要： The present invention relates to a method for determining the thickness of material by penetrating the material, in particular a method for measuring the thickness of walls, ceilings and floors, with which a measurement signal (28) in the gigahertz frequency range emitted using a high-frequency transmitter (24) penetrates the material (10) to be investigated at least once and is detected by a high-frequency receiver (38).According to the present invention, it is provided that the thickness (d) of the material (10) is measured via at least two transit-time measurements of the measurement signal (28) performed at various positions (20, 22) of the high-frequency transmitter (24) and/or the high-frequency receiver (34).The present invention also relates to a device system (12; 40, 140, 240, 340) for carrying out the method described above.

    摘要翻译： 本发明涉及一种通过穿透材料来确定材料厚度的方法，特别是一种用于测量墙壁，天花板和地板的厚度的方法，利用该方法，使用高的数字发射千兆赫兹频率范围内的测量信号（28） - 频率发射器（24）至少一次穿透待研究的材料（10），并由高频接收器（38）检测。 根据本发明，通过在高位（20,22）的各个位置（20,22）处执行的测量信号（28）的至少两次渡越时间测量来测量材料（10）的厚度（d） 频率发射机（24）和/或高频接收机（34）。 本发明还涉及用于执行上述方法的装置系统（12; 40,140,​​240,340）。