DETERMINING IDLER WEAR BASED ON POSITION OF IDLER ASSEMBLY

    公开(公告)号:US20240210155A1

    公开(公告)日:2024-06-27

    申请号:US18069673

    申请日:2022-12-21

    CPC classification number: G01B7/10 B62D55/145 B62D55/32

    Abstract: In some implementations, a controller may receive, from a sensor system of the machine, sensor data indicating a movement of an idler block of an idler assembly of an undercarriage of the machine. The controller may determine, based on the sensor data, that the idler block has moved from a first position to a second position. The controller may determine an amount of wear of an idler of the idler assembly based on the idler block moving from the first position to the second position. The controller may determine whether the amount of wear satisfies a wear threshold. The controller may cause the machine to perform an action based on determining whether the amount of wear satisfies the wear threshold.

    METHOD OF PREDICTING WEAR ON TUBES OF STEAM GENERATOR

    公开(公告)号:US20180142884A1

    公开(公告)日:2018-05-24

    申请号:US15807801

    申请日:2017-11-09

    Abstract: A method predicts an amount of wear that is expected to occur on the tubes of a steam generator as a result of vibration against another structure within the steam generator. The method includes determining a volumetric amount of material that has been worn from a location on a tube over a duration of time and employing that volume as a function of time to determine the volume of material of the tube wall that is predicted to be worn from the tube or another tube at a future time. The volumetric-based analysis enables more accurately prediction of the wear depth at a future time. This enables the plugging of only those tubes that are determined from a volumetric analysis to be in risk of breach at the future time, thus slowing the rate at which tubes of a steam generator will be plugged.

    THIN FILM MEASURING APPARATUS AND THIN FILM MEASURING METHOD

    公开(公告)号:US20180135959A1

    公开(公告)日:2018-05-17

    申请号:US15635214

    申请日:2017-06-28

    Abstract: A thin film measuring apparatus includes a first sensing module, a second sensing module, and a processing device. The thin film measuring apparatus is configured to non-contact measure a multilayer thin film. The first sensing module and the second sensing module are respectively configured to generate alternating magnetic fields, and respectively sense magnetic field changes correspondingly generated by the multilayer thin film. The processing device has a parameter database. The processing device obtains a first impedance value and a second impedance value of the multilayer thin film according to sensing results of the first sensing module and the second sensing module. The processing device performs a thickness calculation operation to obtain a first thickness value and a second thickness value of the multilayer thin film according to the first impedance value, the second impedance value, and the parameter database. A thin film measuring method is also provided.

    Sensor arrangement for combine harvester

    公开(公告)号:US09832927B2

    公开(公告)日:2017-12-05

    申请号:US15313427

    申请日:2015-05-26

    Inventor: Bart Moutton

    Abstract: A sensor for measuring a thickness of a layer of a grain/residue mixture as the layer is transported through a cleaning arrangement of a combine harvester. The sensor is mounted on a support surface of a grain pan or a sieve of the cleaning arrangement and comprises a tower-shaped support structure with sensor elements attached to the structure and forming a vertical stack of sensor elements, so that a number of sensor elements is submerged in the layer and a number of sensor elements extends above the layer. The sensor elements are configured to measure an electrical property that changes as a function of immediate surroundings of the sensor elements. The sensor elements are configured to be read out independently from each other.

    Method of electromagnetic defectoscopy for multi-string wells and the electromagnetic downhole defectoscope

    公开(公告)号:US09772308B2

    公开(公告)日:2017-09-26

    申请号:US14007973

    申请日:2012-12-03

    Applicant: MIKS LLC

    Abstract: This invention relates to the monitoring of the integrity of casing, tubing and other strings in oil and gas wells. The technical result of this invention consists in increased accuracy and trustworthiness in detecting and locating transverse and longitudinal defects in well completion components and downhole equipment, in both the magnetic and non-magnetic first, second and other metal barriers. Electromagnetic defectoscopy in multi-string wells includes measuring EMF induced in a coil by eddy currents generated in metal barriers by the decay of the electromagnetic field produced by magnetization current pulses in the coil. A series of pulses of fixed duration in the range of 0.1-1000 ms is fed to each exciter-and-pickup coil to sequentially magnetize all metal barriers starting from the nearest one, with pulse durations increasing for each next barrier. The recorded data are saved and processed by comparing them with model data, and the processing results indicate detects in the metal barriers. The downhole electromagnetic defectoscope contains a case, axially oriented coils with their magnetic axes coinciding with the tool's magnetic axis, and an electronic module, and at least two exciter-and-pickup coils, each consisting of an exciter coil and a pickup coil with a single core. The exciter-and-pickup coils are of different sizes and are spaced apart by a distance of not less than the length of the larger exciter-and-pickup coil.

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