Imaging apparatus and method
    1.
    发明授权
    Imaging apparatus and method 有权
    成像设备及方法

    公开(公告)号:US07335883B2

    公开(公告)日:2008-02-26

    申请号:US10489542

    申请日:2002-07-29

    IPC分类号: G01N21/17

    摘要: A method of imaging a sample, the method comprising: (a) irradiating a sample with a pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 25 GHz to 100 THz; (b) determining a first parameter related to the amplitude of the radiation, which is either reflected from and/or transmitted by the sample, in the time domain; (c) calculating the value of the first parameter at a first time value relative to the value of the first parameter at a second time value which coincides with a physical feature of the dataset of the first parameter with respect to time; and (d) generating an image by plotting the value calculated in step (c) for different points of the sample.

    摘要翻译: 一种对样品成像的方法,所述方法包括:(a)用电磁辐射脉冲照射样品,所述脉冲具有在25GHz至100THz范围内的多个频率; (b)在时域中确定与样品反射和/或透射的辐射幅度相关的第一参数; (c)在与第一参数的数据集相对于时间的物理特征相符合的第二时间值处,相对于第一参数的值计算第一参数的值; 以及(d)通过绘制样品的不同点的步骤(c)中计算出的值来生成图像。

    Scanning terahertz probe
    2.
    发明授权
    Scanning terahertz probe 有权
    扫描太赫兹探头

    公开(公告)号:US09006660B2

    公开(公告)日:2015-04-14

    申请号:US12675887

    申请日:2008-08-28

    摘要: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).

    摘要翻译: 一种用于检查物体(8)的太赫兹辐射探针(1),所述探头包括构造成沿第一方向(5)插入所述物体的开口中的第一部分,所述探针还包括至少一个太赫兹发射器(15) ),用于经由位于所述第一部分并且随后从所述物体到达至少一个THz检测器(17)的孔(2)将从所述发射器发射的THz辐射引导到所述物体的引导装置(7)和用于扫描所述发射 所述扫描方向上所述物体的太赫兹辐射,所述扫描方向具有所述第一方向(5)的分量。

    SCANNING TERAHERTZ PROBE
    3.
    发明申请
    SCANNING TERAHERTZ PROBE 有权
    扫描TERAHERTZ探头

    公开(公告)号:US20110028824A1

    公开(公告)日:2011-02-03

    申请号:US12675887

    申请日:2008-08-28

    IPC分类号: A61B6/00 A61B5/00 G01J5/02

    摘要: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).

    摘要翻译: 一种用于检查物体(8)的太赫兹辐射探针(1),所述探头包括构造成沿第一方向(5)插入所述物体的开口中的第一部分,所述探针还包括至少一个太赫兹发射器(15) ),用于经由位于所述第一部分并且随后从所述物体到达至少一个THz检测器(17)的孔(2)将从所述发射器发射的THz辐射引导到所述物体的引导装置(7)和用于扫描所述发射 所述扫描方向上所述物体的太赫兹辐射,所述扫描方向具有所述第一方向(5)的分量。