摘要:
In a first aspect, a first apparatus is provided. The first apparatus is a memory element that includes (1) one or more MOSFETs each including a dielectric material having a dielectric constant of about 3.9 to about 25; and (2) control logic coupled to at least one of the one or more MOSFETs. The control logic is adapted to (a) cause the memory element to operate in a first mode to store data; and (b) cause the memory element to operate in a second mode to change a threshold voltage of at least one of the one or more MOSFETs from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects data stored by the memory element when operated in the first mode. Numerous other aspects are provided.
摘要:
In a first aspect, a first method of adjusting capacitance of a semiconductor device is provided. The first method includes the steps of (1) providing a transistor including a dielectric material having a dielectric constant of about 3.9 to about 25, wherein the transistor is adapted to operate in a first mode to provide a capacitance and further adapted to operate in a second mode to change a threshold voltage of the transistor from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects a capacitance provided by the transistor when operated in the first mode; and (2) employing the transistor in a circuit. Numerous other aspects are provided.
摘要:
In a first aspect, a first apparatus is provided. The first apparatus is a memory element that includes (1) one or more MOSFETs each including a dielectric material having a dielectric constant of about 3.9 to about 25; and (2) control logic coupled to at least one of the one or more MOSFETs. The control logic is adapted to (a) cause the memory element to operate in a first mode to store data; and (b) cause the memory element to operate in a second mode to change a threshold voltage of at least one of the one or more MOSFETs from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects data stored by the memory element when operated in the first mode. Numerous other aspects are provided.
摘要:
In a first aspect, a first apparatus is provided. The first apparatus is a memory element that includes (1) one or more MOSFETs each including a dielectric material having a dielectric constant of about 3.9 to about 25; and (2) control logic coupled to at least one of the one or more MOSFETs. The control logic is adapted to (a) cause the memory element to operate in a first mode to store data; and (b) cause the memory element to operate in a second mode to change a threshold voltage of at least one of the one or more MOSFETs from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects data stored by the memory element when operated in the first mode. Numerous other aspects are provided.
摘要:
In a first aspect, a first method of adjusting capacitance of a semiconductor device is provided. The first method includes the steps of (1) providing a transistor including a dielectric material having a dielectric constant of about 3.9 to about 25, wherein the transistor is adapted to operate in a first mode to provide a capacitance and further adapted to operate in a second mode to change a threshold voltage of the transistor from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects a capacitance provided by the transistor when operated in the first mode; and (2) employing the transistor in a circuit. Numerous other aspects are provided.
摘要:
An integrated circuit, including: a pulse generator adapted to generate a pulsed signal; a cycle counter adapted to count cycles of the pulsed signal; one or more repairable circuit elements; and a repair processor adapted to repair a repairable circuit element when the cycle counter reaches a pre-determined cycle count.
摘要:
A circuit for preventing failure in an integrated circuit. The circuit including: an original circuit; one or more redundant circuits; and a repair processor, including a clock cycle counter configured to count pulses of a pulsed signal, the repair processor configured to (a) replace the original circuit with a first redundant circuit or (b) configured to select another redundant circuit, the selection in sequence from a second redundant circuit to a last redundant circuit, and to replace a previously selected redundant circuit with the selected redundant circuit each time the cycle counter reaches a predetermined count of a set of pre-determined cycle counts.
摘要:
An integrated circuit, including: a pulse generator adapted to generate a pulsed signal; a cycle counter adapted to count cycles of the pulsed signal; one or more repairable circuit elements; and a repair processor adapted to repair a repairable circuit element when the cycle counter reaches a pre-determined cycle count.
摘要:
A circuit for preventing failure in an integrated circuit. The circuit including: an original circuit; one or more redundant circuits; and a repair processor, including a clock cycle counter configured to count pulses of a pulsed signal, the repair processor configured to (a) replace the original circuit with a first redundant circuit or (b) configured to select another redundant circuit, the selection in sequence from a second redundant circuit to a last redundant circuit, and to replace a previously selected redundant circuit with the selected redundant circuit each time the cycle counter reaches a predetermined count of a set of pre-determined cycle counts.
摘要:
A first, “known good” reference off-chip driver circuit actuated by an initial logic program (IPL) input signal has an output lead connected as one of the inputs to a comparator circuit for providing a reference off-chip driver output signal. A second off-chip driver circuit including a plurality of “n” separate driver circuit paths connected to input signal and produces output signals connected to a common node to provide output driver signals to the common node. The common node is connected to the second input of the comparator circuit for comparison with the reference off-chip driver output signal from the first off-chip driver circuit to determine the operating state of the second off-chip driver circuit with respect to the operating state of the first off-chip driver circuit.