公开(公告)号：US20250013586A1

公开(公告)日：2025-01-09

申请号：US18891506

申请日：2024-09-20

Applicant: Waymo LLC

Inventor： Sabareeshkumar Ravikumar ,  Shishuang Sun ,  Feng Wang ,  Ji Zhang

IPC: G06F13/16 ,  G06F12/02 ,  G06F13/42

Abstract: One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.

公开(公告)号：US12124386B2

公开(公告)日：2024-10-22

申请号：US18523433

申请日：2023-11-29

Applicant: Waymo LLC

Inventor： Sabareeshkumar Ravikumar ,  Shishuang Sun ,  Feng Wang ,  Ji Zhang

IPC: G06F13/16 ,  G06F12/02 ,  G06F13/42

CPC classification number: G06F13/1668 ,  G06F12/0246 ,  G06F13/4234 ,  G06F2212/7209

Abstract: One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.

公开(公告)号：US11868286B1

公开(公告)日：2024-01-09

申请号：US18045015

申请日：2022-10-07

Applicant: Waymo LLC

Inventor： Sabareeshkumar Ravikumar ,  Shishuang Sun ,  Feng Wang ,  Ji Zhang

IPC: G06F13/16 ,  G06F12/02 ,  G06F13/42

CPC classification number: G06F13/1668 ,  G06F12/0246 ,  G06F13/4234 ,  G06F2212/7209

Abstract: One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.

公开(公告)号：US11494317B1

公开(公告)日：2022-11-08

申请号：US17137264

申请日：2020-12-29

Applicant: Waymo, LLC

Inventor： Sabareeshkumar Ravikumar ,  Shishuang Sun ,  Feng Wang ,  Ji Zhang

IPC: G06F13/16 ,  G06F12/02 ,  G06F13/42

Abstract: One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.

公开(公告)号：US20240095197A1

公开(公告)日：2024-03-21

申请号：US18523433

申请日：2023-11-29

Applicant: Waymo LLC

Inventor： Sabareeshkumar Ravikumar ,  Shishuang Sun ,  Feng Wang ,  Ji Zhang

IPC: G06F13/16 ,  G06F12/02 ,  G06F13/42

CPC classification number: G06F13/1668 ,  G06F12/0246 ,  G06F13/4234 ,  G06F2212/7209

Abstract: One example method of testing an electrical device comprises transmitting a data pattern to a memory device of the electrical device by a controller of the electrical device to provide a written data pattern to the memory device, wherein the data pattern replicates a resonant frequency of at least a portion of the electrical device, reading the written data pattern from the memory device with the controller, and comparing the written data pattern to the data pattern.