METHOD FOR CHECKING A SEMICONDUCTOR SWITCH FOR A FAULT

    公开(公告)号:US20220158633A1

    公开(公告)日:2022-05-19

    申请号:US17435583

    申请日:2020-02-27

    Applicant: Webasto SE

    Inventor: Philipp ECK

    Abstract: The invention provides a method for checking a semiconductor switch for a fault, wherein the semiconductor switch is driven with a PWM signal with a variable duty cycle. To the benefit of determining faults on the semiconductor switch reliably and cost-effectively, it is provided that if the semiconductor switch is operated with a duty cycle of 100% or 0%, the current measurement of the overall system is evaluated, while if the semiconductor switch is operated with a duty cycle of between 0% and 100%, the generated voltage pulses across the semiconductor switch are evaluated.

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