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公开(公告)号：US20110055644A1
公开(公告)日：2011-03-03
申请号：US12549164
申请日：2009-08-27
CPC分类号： G11C29/44 , G11C29/4401 , G11C2029/0401 , G11C2029/1208 , G11C2029/4402
摘要： Failure and repair information collected during self-testing of arrays in an integrated circuit is stored in a centralized array in the integrated circuit. In that way, a centralized array can be read out to provide failure and repair information on the arrays in the integrated circuit rather than having to read from each array. In addition, the failure and repair information may also be stored in the array under test for certain of the arrays.
摘要翻译： 在集成电路中的阵列自检期间收集的故障和修复信息存储在集成电路中的集中式阵列中。 以这种方式，可以读取集中式阵列，以提供集成电路中阵列的故障和修复信息，而不必从每个阵列读取。 此外，故障和修复信息也可能存储在被测阵列中的某些阵列中。
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公开(公告)号：US08392777B2
公开(公告)日：2013-03-05
申请号：US12549164
申请日：2009-08-27
IPC分类号： G01R31/28
CPC分类号： G11C29/44 , G11C29/4401 , G11C2029/0401 , G11C2029/1208 , G11C2029/4402
摘要： Failure and repair information collected during self-testing of arrays in an integrated circuit is stored in a centralized array in the integrated circuit. In that way, a centralized array can be read out to provide failure and repair information on the arrays in the integrated circuit rather than having to read from each array. In addition, the failure and repair information may also be stored in the array under test for certain of the arrays.
摘要翻译： 在集成电路中的阵列自检期间收集的故障和修复信息存储在集成电路中的集中式阵列中。 以这种方式，可以读取集中式阵列，以提供集成电路中阵列的故障和修复信息，而不必从每个阵列读取。 此外，故障和修复信息也可能存储在被测阵列中的某些阵列中。
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