公开(公告)号：US20060289190A1

公开(公告)日：2006-12-28

申请号：US11249409

申请日：2005-10-14

申请人： Winston Mok ,  Alexander Koch ,  Arkady Ivannikov

发明人： Winston Mok ,  Alexander Koch ,  Arkady Ivannikov

IPC分类号： H02G3/08 ,  H05K9/00

CPC分类号： G01R29/0821 ,  H05K9/0007

摘要： An RF isolation container that includes a counterweight system to assist an operator with opening and closing operations, an electromagnet locking mechanism for easier and consistent locking of the RF isolation container and a motion damping mechanism to relieve fatigue on operating components and on human operators.

摘要翻译： 一种RF隔离容器，其包括用于辅助操作者打开和关闭操作的配重系统，用于更容易且一致地锁定RF隔离容器的电磁体锁定机构和用于减轻操作部件和人类操作者的疲劳的运动阻尼机构。

公开(公告)号：US07388160B2

公开(公告)日：2008-06-17

申请号：US11249409

申请日：2005-10-14

申请人： Winston Mok ,  Alexander Koch ,  Arkady Ivannikov

发明人： Winston Mok ,  Alexander Koch ,  Arkady Ivannikov

IPC分类号： H05K9/00 ,  G01R31/02

CPC分类号： G01R29/0821 ,  H05K9/0007

摘要： An RF isolation container that includes a counterweight system to assist an operator with opening and closing operations, an electromagnet locking mechanism for easier and consistent locking of the RF isolation container and a motion damping mechanism to relieve fatigue on operating components and on human operators.

摘要翻译： 一种RF隔离容器，其包括用于辅助操作者打开和关闭操作的配重系统，用于更容易且一致地锁定RF隔离容器的电磁体锁定机构和用于减轻操作部件和人类操作者的疲劳的运动阻尼机构。

公开(公告)号：US07807933B2

公开(公告)日：2010-10-05

申请号：US12117186

申请日：2008-05-08

申请人： Winston Mok ,  Alexander Koch ,  Arkady Ivannikov

发明人： Winston Mok ,  Alexander Koch ,  Arkady Ivannikov

IPC分类号： H05K9/00 ,  G01R31/02

CPC分类号： G01R29/0821 ,  H05K9/0007

摘要： An RF isolation container that includes a counterweight system to assist an operator with opening and closing operations, an electromagnet locking mechanism for easier and consistent locking of the RF isolation container and a motion damping mechanism to relieve fatigue on operating components and on human operators.

摘要翻译： 一种RF隔离容器，其包括用于辅助操作者打开和关闭操作的配重系统，用于更容易且一致地锁定RF隔离容器的电磁体锁定机构和用于减轻操作部件和人类操作者的疲劳的运动阻尼机构。

公开(公告)号：US20070132259A1

公开(公告)日：2007-06-14

申请号：US11297487

申请日：2005-12-09

申请人： Arkady Ivannikov ,  Winston Mok ,  Niall Gallagher

发明人： Arkady Ivannikov ,  Winston Mok ,  Niall Gallagher

IPC分类号： A45F5/10

CPC分类号： H04B1/3877 ,  A45F5/00 ,  A45F5/10

摘要： The transport frame has engagement elements configured to engage and hold a battery-operated electronic device via its battery compartment and/or securing elements for the battery compartment cover only. The engagement elements optionally may be movable apart to secure the device, for example by a lever-actuated cam against spring biasing. The transport frame optionally may be mounted in a fixture, for example at a testing location, the transport frame and fixture being configured in complementary fashion whereby the transport frame is mountable in the fixture for any desired purpose, for example to facilitate testing of the device at the fixture location.

摘要翻译： 运输框架具有接合元件，其配置成通过其电池舱和/或仅用于电池舱盖的固定元件来接合和保持电池供电的电子设备。 接合元件可选地可移动地分开以固定该装置，例如通过杠杆致动的凸轮抵抗弹簧偏压。 运输框架可选地可以安装在固定装置中，例如在测试位置处，运输框架和固定装置以互补的方式构造，由此运输框架可安装在固定装置中以用于任何期望的目的，例如以便于装置的测试 在夹具位置。

公开(公告)号：US07268567B2

公开(公告)日：2007-09-11

申请号：US11051012

申请日：2005-02-04

申请人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

发明人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

IPC分类号： G01R31/02

CPC分类号： G01R1/06705

摘要： An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

摘要翻译： 改进的测试探针组件具有改进的安装组件，其提供测试探针相对于基座的多方向运动自由度，以便抵抗经常对测试探针造成的损坏。 改进的安装组件可以例如包括设置在基座上的至少第一弹性支架，并且具有至少第一支撑件和至少第一弹性元件。 当测试探针接合诸如被测设备（DUT）的结构时，至少第一弹性元件（例如可以是至少第一弹簧）是可偏转的。 因此，本发明的改进的测试探针组件可以偏转无限数量的位置，以便抵抗例如由探针和被测物之间的对准引起的损伤。

公开(公告)号：US07675304B2

公开(公告)日：2010-03-09

申请号：US12360323

申请日：2009-01-27

申请人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

发明人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

IPC分类号： G01R31/02

CPC分类号： G01R1/06705

摘要： An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

摘要翻译： 改进的测试探针组件具有改进的安装组件，其提供测试探针相对于基座的多方向运动自由度，以便抵抗经常对测试探针造成的损坏。 改进的安装组件可以例如包括设置在基座上的至少第一弹性支架，并且具有至少第一支撑件和至少第一弹性元件。 当测试探针接合诸如被测设备（DUT）的结构时，至少第一弹性元件（例如可以是至少第一弹簧）是可偏转的。 因此，本发明的改进的测试探针组件可以偏转无限数量的位置，以便抵抗例如由探针和被测物之间的对准引起的损伤。

公开(公告)号：US20090134899A1

公开(公告)日：2009-05-28

申请号：US12360323

申请日：2009-01-27

申请人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

发明人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

IPC分类号： G01R31/02

CPC分类号： G01R1/06705

摘要： An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

摘要翻译： 改进的测试探针组件具有改进的安装组件，其提供测试探针相对于基座的多方向运动自由度，以便抵抗经常对测试探针造成的损坏。 改进的安装组件可以例如包括设置在基座上的至少第一弹性支架，并且具有至少第一支撑件和至少第一弹性元件。 当测试探针接合诸如被测设备（DUT）的结构时，至少第一弹性元件（例如可以是至少第一弹簧）是可偏转的。 因此，本发明的改进的测试探针组件可以偏转无限数量的位置，以便抵抗例如由探针和被测物之间的对准引起的损伤。

公开(公告)号：US20060176065A1

公开(公告)日：2006-08-10

申请号：US11051012

申请日：2005-02-04

申请人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

发明人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

IPC分类号： G01R31/02

CPC分类号： G01R1/06705

摘要： An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

公开(公告)号：US07528596B2

公开(公告)日：2009-05-05

申请号：US11762420

申请日：2007-06-13

申请人： Arkady Ivannikov ,  Alexander Koch ,  Marek Reksnis

发明人： Arkady Ivannikov ,  Alexander Koch ,  Marek Reksnis

IPC分类号： G01R31/28 ,  H04W24/00

CPC分类号： H04Q1/20 ,  G01R1/0408 ,  H04M1/04 ,  H04M1/24

摘要： A fixture is provided for functional testing of an assembled wireless device. The wireless device has a first port and a second port. The fixture comprises: a base having an opening formed therein for receiving a retainer, the retainer being rotatably mounted in the opening for rotating from a first position to a second position, the retainer for receiving the wireless device while in the first position; a first connector mounted in the retainer for engaging the first port of the wireless device when the wireless device is received by the retainer in the first position; and a second connector rotatably mounted on the base, the second connector for engaging the second port of the wireless device when the retainer is rotated to the second position.

摘要翻译： 提供固定装置用于组装的无线装置的功能测试。 无线设备具有第一端口和第二端口。 该固定装置包括：基座，其中形成有用于接收保持器的开口，该保持器可旋转地安装在开口中，用于从第一位置转动到第二位置;保持器，用于在处于第一位置时接收无线装置; 当所述无线设备在所述第一位置被所述保持器接收时，安装在所述保持器中用于接合所述无线设备的所述第一端口的第一连接器; 以及第二连接器，其可旋转地安装在所述基座上，所述第二连接器用于当所述保持器旋转到所述第二位置时与所述无线装置的所述第二端口接合。

公开(公告)号：US07501841B2

公开(公告)日：2009-03-10

申请号：US11780913

申请日：2007-07-20

申请人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

发明人： Alexander Koch ,  Arkady Ivannikov ,  Ted Toth

IPC分类号： G01R31/02

CPC分类号： G01R1/06705

摘要： An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

摘要翻译： 改进的测试探针组件具有改进的安装组件，其提供测试探针相对于基座的多方向运动自由度，以便抵抗经常对测试探针造成的损坏。 改进的安装组件可以例如包括设置在基座上的至少第一弹性支架，并且具有至少第一支撑件和至少第一弹性元件。 当测试探针接合诸如被测设备（DUT）的结构时，至少第一弹性元件（例如可以是至少第一弹簧）是可偏转的。 因此，本发明的改进的测试探针组件可以偏转无限数量的位置，以便抵抗例如由探针和被测物之间的对准引起的损伤。