Position measuring system
    1.
    发明申请
    Position measuring system 审中-公开
    位置测量系统

    公开(公告)号:US20060092428A1

    公开(公告)日:2006-05-04

    申请号:US11265967

    申请日:2005-11-02

    IPC分类号: G01B11/14 G01B11/02

    CPC分类号: G01D5/36 G01D5/347 G01D5/38

    摘要: A position measuring system for determining the relative position of two objects includes a power supply unit for generating a variable operating current for a laser light source. At least one photodetector generates position-dependent output signals from the light received from the laser light source. In measurement operation, the power supply unit provides a direct current having a superimposed alternating current component to the laser light source.

    摘要翻译: 用于确定两个物体的相对位置的位置测量系统包括用于产生激光光源的可变工作电流的电源单元。 至少一个光电检测器从从激光光源接收的光产生与位置相关的输出信号。 在测量操作中,电源单元向激光源提供具有叠加的交流分量的直流电。

    Scanner unit for an optical position measuring device
    2.
    再颁专利
    Scanner unit for an optical position measuring device 有权
    用于光学位置测量装置的扫描仪单元

    公开(公告)号:USRE40676E1

    公开(公告)日:2009-03-24

    申请号:US11057106

    申请日:2005-02-11

    IPC分类号: G02B11/14 H01J5/16

    摘要: A scanning unit for an optical position measuring device, which is suited for optically scanning a scale graduation, to produce positionally dependent scanning signals on the basis of scale graduation. The scanning unit includes a carrier element, at least one optoelectronic component, which is arranged on the carrier element, a radiation-sensitive or a radiation-emitting surface region of the component being oriented to face away from the carrier element. Provision is also made for at least one electrically conductive connector lead between the carrier element and a contacting region of the component. An at least semi-transparent cover element is arranged directly on the radiation-sensitive and/or radiation-emitting surface region of the component. In this case, the cover element is arranged in such a way with respect to the component that the contacting region of the component is not covered by it and, in addition, the thickness of the cover element is selected so as to ensure that the top side of the cover element exceeds the height of the connector lead in the contacting region.

    摘要翻译: 用于光学位置测量装置的扫描单元,其适于光刻扫描刻度,以基于刻度刻度产生位置依赖的扫描信号。 扫描单元包括载体元件,布置在载体元件上的至少一个光电子元件,该元件的辐射敏感或辐射发射表面区域被定向为远离载体元件。 还提供了在载体元件和部件的接触区域之间的至少一个导电连接器引线。 至少半透明覆盖元件直接布置在部件的辐射敏感和/或辐射发射表面区域上。 在这种情况下,盖部件相对于部件的接触区域不被其覆盖的部件配置,另外,选择盖元件的厚度,以确保顶部 盖元件的一侧超过接触区域中连接器引线的高度。

    Scanner unit for an optical position measuring device

    公开(公告)号:US06519044B1

    公开(公告)日:2003-02-11

    申请号:US09251066

    申请日:1999-02-18

    IPC分类号: G01B1114

    摘要: A scanning unit for an optical position measuring device, which is suited for optically scanning a scale graduation, to produce positionally dependent scanning signals on the basis of scale graduation. The scanning unit includes a carrier element, at least one optoelectronic component, which is arranged on the carrier element, a radiation-sensitive or a radiation-emitting surface region of the component being oriented to face away from the carrier element. Provision is also made for at least one electrically conductive connector lead between the carrier element and a contacting region of the component. An at least semi-transparent cover element is arranged directly on the radiation-sensitive and/or radiation-emitting surface region of the component. In this case, the cover element is arranged in such a way with respect to the component that the contacting region of the component is not covered by it and, in addition, the thickness of the cover element is selected so as to ensure that the top side of the cover element exceeds the height of the connector lead in the contacting region.

    Position measuring system
    4.
    发明授权

    公开(公告)号:US06526190B2

    公开(公告)日:2003-02-25

    申请号:US09993944

    申请日:2001-11-14

    IPC分类号: G02B600

    摘要: A position measuring system that includes a graduation support having a measuring graduation, a planar waveguide and a light source that generates light that is conducted to the measuring graduation, wherein the light is reflected at surfaces of the planar waveguide. A scanning unit for scanning the measuring graduation that includes a light-sensitive scanning area to which light modulated by the measuring graduation is conducted. The modulated light conducted to the light-sensitive scanning area has at least two different light portions, which differ in a number of reflections at the surfaces of the planar waveguide, and wherein the reflecting of the at least two different light portions occurs prior to reaching the measuring graduation.