Ramp temperature techniques for improved mean wafer before clean
    1.
    发明授权
    Ramp temperature techniques for improved mean wafer before clean 有权
    用于在清洁之前改善平均晶片的斜坡温度技术

    公开(公告)号:US07205205B2

    公开(公告)日:2007-04-17

    申请号:US10712464

    申请日:2003-11-12

    IPC分类号: H01L21/76

    摘要: A method of operating a substrate processing chamber comprising transferring a first substrate into the substrate processing chamber and heating the substrate to a first temperature of at least 510° C.; depositing an insulating layer over the first substrate while reducing the temperature of the substrate from the first temperature to a second temperature that is lower than the first temperature; transferring the first substrate out of the substrate processing chamber; removing unwanted deposition material formed on interior surfaces of the chamber during the depositing step by introducing reactive halogen species into the chamber while increasing the temperature of chamber; transferring a second substrate into the substrate processing chamber and heating the substrate to the first temperature; and depositing an insulating layer over the second substrate while reducing the temperature of the substrate from the first temperature to the second temperature.

    摘要翻译: 一种操作衬底处理室的方法,包括将第一衬底转移到衬底处理室中并将衬底加热至至少510℃的第一温度; 在第一衬底上沉积绝缘层,同时将衬底的温度从第一温度降低到低于第一温度的第二温度; 将所述第一衬底转移出所述衬底处理室; 在沉积步骤期间,通过将反应性卤素物质引入室中,同时增加室的温度来除去在室的内表面上形成的不需要的沉积材料; 将第二衬底转移到衬底处理室中并将衬底加热到​​第一温度; 以及在第二衬底上沉积绝缘层,同时将衬底的温度从第一温度降低到第二温度。