公开(公告)号：US08331649B2

公开(公告)日：2012-12-11

申请号：US12630448

申请日：2009-12-03

申请人： Won Soo Ji ,  Wook Hee Lee ,  Ho Young Song ,  Chong Wook Cho ,  Sung Jae Kim ,  Young Su Yun ,  Hong Min Kim

发明人： Won Soo Ji ,  Wook Hee Lee ,  Ho Young Song ,  Chong Wook Cho ,  Sung Jae Kim ,  Young Su Yun ,  Hong Min Kim

IPC分类号： G06K9/00

CPC分类号： G06K9/2018 ,  G01R31/2635 ,  G01R31/2656 ,  G06T7/0004 ,  G06T2207/30148

摘要： There is provided an LED testing apparatus. An LED testing apparatus according to an aspect of the invention may include: a first lighting unit generating first light and irradiating the first light onto an LED having an encapsulant including a fluorescent material excited by the first light to emit light having a longer wavelength than the first light; a second lighting unit generating second light having a longer wavelength than the first light to irradiate the second light onto the LED; an image acquisition unit receiving the light emitted from the fluorescent material and the second light reflected off the LED to acquire images of the LED; and an LED state determination unit determining whether the LED is acceptable or defective using the images of the LED acquired by the image acquisition unit.

摘要翻译： 提供了LED测试装置。 根据本发明的一个LED测试装置可以包括：第一照明单元，其产生第一光并将第一光照射到具有包含由第一光激发的荧光材料的密封剂的LED上，以发射具有比第 第一光; 第二照明单元产生具有比第一光更长的波长的第二光，以将第二光照射到LED上; 接收从荧光材料发射的光和从LED反射的第二光的图像获取单元，以获取LED的图像; 以及LED状态确定单元，使用由图像获取单元获取的LED的图像确定LED是否可接受或有缺陷。