METHODOLOGY FOR PERFORMING POST LAYER GENERATION CHECK
    1.
    发明申请
    METHODOLOGY FOR PERFORMING POST LAYER GENERATION CHECK 有权
    用于执行后层生成检查的方法

    公开(公告)号:US20130074016A1

    公开(公告)日:2013-03-21

    申请号:US13234117

    申请日:2011-09-15

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5081

    摘要: There is provided a method comprising receiving data corresponding to a layout design for a plurality of input mask layers and generating a layout design for at least one generated mask layer. The relationship between a first geometric element in a first layout pattern comprising one or more of the generated mask layers and a second geometric element in a second layout pattern is then determined and verified to check if they comply with predetermined rules. If the relationship does not conform with the predetermined rules the design of at least one of the generated mask layers associated with the first or second layout pattern is modified.

    摘要翻译: 提供了一种方法,包括接收对应于多个输入掩模层的布局设计的数据,并为至少一个生成的掩模层生成布局设计。 然后确定并验证包括生成的掩模层中的一个或多个的第一布局图案中的第一几何元素与第二布局图案中的第二几何元素之间的关系,以检查它们是否符合预定规则。 如果关系不符合预定规则,则修改与第一或第二布局图案相关联的所生成的掩模层中的至少一个的设计。