公开(公告)号：US20210192831A1

公开(公告)日：2021-06-24

申请号：US16721661

申请日：2019-12-19

Applicant: X Development LLC

Inventor： Sylvia J. Smullin ,  Albin Lee Jones ,  Joseph Sargent ,  Marina Dolivo

IPC: G06T15/08 ,  G06T17/00 ,  G06F30/17 ,  B33Y50/02 ,  G06T19/20

Abstract: In some embodiments, techniques are provided for analyzing the manufacturability or fabricability of objects based on segmented designs. In some embodiments, a scanning device scans a manufacturing device and/or an object manufactured by the manufacturing device to characterize a manufacturing capability of the manufacturing device. A paintbrush pattern may be determined based on the characterization, and a proposed design may be determined to be fabricable or non-fabricable using the paintbrush pattern.

公开(公告)号：US11127192B2

公开(公告)日：2021-09-21

申请号：US16721661

申请日：2019-12-19

Applicant: X Development LLC

Inventor： Sylvia J. Smullin ,  Albin Lee Jones ,  Joseph Sargent ,  Marina Dolivo

IPC: G06T15/08 ,  G06T17/00 ,  G06T19/20 ,  B33Y50/02 ,  G06F30/17

Abstract: In some embodiments, techniques are provided for analyzing the manufacturability or fabricability of objects based on segmented designs. In some embodiments, a scanning device scans a manufacturing device and/or an object manufactured by the manufacturing device to characterize a manufacturing capability of the manufacturing device. A paintbrush pattern may be determined based on the characterization, and a proposed design may be determined to be fabricable or non-fabricable using the paintbrush pattern.