Artifact identification in EEG measurements

    公开(公告)号:US11576601B2

    公开(公告)日:2023-02-14

    申请号:US16388709

    申请日:2019-04-18

    Abstract: Methods, systems, and computer programs encoded on a computer storage medium, for improving EEG measurements by identifying artifacts present in EEG measurements and providing a real-time indication to a user of likely artifacts in EEG measurements are described. EEG measurements of a patient can be obtained by placing a wearable device or EEG cap on a patient's head. Sensors in the cap provide EEG data to a computing device that processes the data to identify one or more artifacts in the EEG data. The artifacts can be identified by conducting one or more operations of determining the signal to noise ratio of the line noise, calculating mutual information between sensor pairs, and applying the p-welch method. Based on the types of artifacts identified, the computing device can output an indicator that provides feedback to the technician performing an EEG test to make adjustments to the test setup.

    ARTIFACT IDENTIFICATION IN EEG MEASUREMENTS
    2.
    发明申请

    公开(公告)号:US20200329990A1

    公开(公告)日:2020-10-22

    申请号:US16388709

    申请日:2019-04-18

    Abstract: Methods, systems, and computer programs encoded on a computer storage medium, for improving EEG measurements by identifying artifacts present in EEG measurements and providing a real-time indication to a user of likely artifacts in EEG measurements are described. EEG measurements of a patient can be obtained by placing a wearable device or EEG cap on a patient's head. Sensors in the cap provide EEG data to a computing device that processes the data to identify one or more artifacts in the EEG data. The artifacts can be identified by conducting one or more operations of determining the signal to noise ratio of the line noise, calculating mutual information between sensor pairs, and applying the p-welch method. Based on the types of artifacts identified, the computing device can output an indicator that provides feedback to the technician performing an EEG test to make adjustments to the test setup.

    REAL-TIME ANALYSIS OF INPUT TO MACHINE LEARNING MODELS

    公开(公告)号:US20200205740A1

    公开(公告)日:2020-07-02

    申请号:US16284561

    申请日:2019-02-25

    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for obtaining feature sets for a first number of diagnostic trials performed with a patient for diagnostic testing, wherein each feature set includes one or more features of electroencephalogram (EEG) signals measured from the patient while the patient is presented with trial content known to stimulate one or more desired human brain systems. Iteratively providing different combinations of the feature sets as input data to a diagnostic machine learning model to obtain model outputs, each model output corresponding to a particular one of the combinations. Determining, based on the model outputs, a consistency metric, the consistency metric indicating whether a quantity of feature sets in the combinations is sufficient to produce accurate output from the diagnostic machine learning model. Selectively ending the diagnostic testing with the patient based on a value of the consistency metric.

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