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    IC layout physical verification method
    1.
    发明授权
    IC layout physical verification method 有权
    IC布局物理验证方法

    公开(公告)号：US07243321B2

    公开(公告)日：2007-07-10

    申请号：US10820365

    申请日：2004-04-07

    申请人： Xiaojun Wang ,  Kenneth Mednick

    发明人： Xiaojun Wang ,  Kenneth Mednick

    IPC分类号： G06F17/50 ,  G06F17/10

    CPC分类号： G06F17/5081

    摘要： Responding to a single command, a layout versus schematic (LVS) tool processes layout data describing positions of conductors on layers of an IC to produce data representing a shape recognition layer depicting boundary shapes of spirals of drawn inductors. The boundary shape of a spiral is the shape of the spiral as viewed from above with all of the layers of conductive material forming the spiral superimposed. The LVS tool then processes the shape recognition layer data to identify the type and position of each drawn inductor, to determine whether each inductor's spiral turns are of uniform width and spacing, to detect connectivity violations, and to determine parameters relating to the shape of the spiral from which its inductance can be computed.

    摘要翻译： 响应于单个命令，布局与原理图（LVS）工具处理描述IC层上的导体位置的布局数据，以产生表示绘制电感器螺旋线的边界形状的形状识别层的数据。 螺旋的边界形状是从上方观察的螺旋形状，其中形成螺旋的所有导电材料层叠加。 然后，LVS工具处理形状识别层数据，以识别每个拉伸电感器的类型和位置，以确定每个电感器的螺旋线圈是否具有均匀的宽度和间距，以检测连接性违例，并确定与 可以计算其电感的螺旋线。

    IC layout physical verification method
    2.
    发明申请
    IC layout physical verification method 有权
    IC布局物理验证方法

    公开(公告)号：US20050229126A1

    公开(公告)日：2005-10-13

    申请号：US10820365

    申请日：2004-04-07

    申请人： Xiaojun Wang ,  Kenneth Mednick

    发明人： Xiaojun Wang ,  Kenneth Mednick

    IPC分类号： G06F17/50

    CPC分类号： G06F17/5081

    摘要： Responding to a single command, a layout versus schematic (LVS) tool processes layout data describing positions of conductors on layers of an IC to produce data representing a shape recognition layer depicting boundary shapes of spirals of drawn inductors. The boundary shape of a spiral is the shape of the spiral as viewed from above with all of the layers of conductive material forming the spiral superimposed. The LVS tool then processes the shape recognition layer data to identify the type and position of each drawn inductor, to determine whether each inductor's spiral turns are of uniform width and spacing, to detect connectivity violations, and to determine parameters relating to the shape of the spiral from which its inductance can be computed.

    摘要翻译： 响应于单个命令，布局与原理图（LVS）工具处理描述IC层上的导体位置的布局数据，以产生表示绘制电感器螺旋线的边界形状的形状识别层的数据。 螺旋的边界形状是从上方观察的螺旋形状，其中形成螺旋的所有导电材料层叠加。 然后，LVS工具处理形状识别层数据，以识别每个拉伸电感器的类型和位置，以确定每个电感器的螺旋线圈是否具有均匀的宽度和间距，以检测连接性违例，并确定与 可以计算其电感的螺旋线。