公开(公告)号：US20190026416A1

公开(公告)日：2019-01-24

申请号：US15658086

申请日：2017-07-24

Applicant: Xilinx, Inc.

Inventor： Akhilesh Mahajan ,  Bokka Abhiram Sai Krishna ,  Keshava Gopal Goud Cheruku

IPC: G06F17/50

CPC classification number: G06F17/5031 ,  G01R31/3177 ,  G06F11/25

Abstract: Monitoring signals in an integrated circuit can include monitoring a probed signal of an integrated circuit using a logic analyzer circuit implemented within the integrated circuit, detecting state changes in the probed signal using the logic analyzer circuit, and generating, within the logic analyzer circuit, a file specifying time stamped state changes of the probed signal.

公开(公告)号：US10922463B1

公开(公告)日：2021-02-16

申请号：US16658123

申请日：2019-10-20

Applicant: Xilinx, Inc.

Inventor： Akhilesh Mahajan ,  K. Nithin Kumar ,  Yashwant Dagar

IPC: G06F30/00 ,  G06F30/34 ,  G06F30/347 ,  G06F115/08

Abstract: Automated system design for a programmable integrated circuit (IC) includes conducting, using computer hardware, a dialogue with a user, wherein the dialogue describes a user design for the programmable IC, extracting, using the computer hardware, a first plurality of features for the user design from the dialog, and generating, using the computer hardware, a design specification for the user design based on the first plurality of features. Using the computer hardware, a device configuration for the user design is generated based on the design specification. The device configuration is loadable within the programmable IC to implement the user design.

公开(公告)号：US10482205B2

公开(公告)日：2019-11-19

申请号：US15658086

申请日：2017-07-24

Applicant: Xilinx, Inc.

Inventor： Akhilesh Mahajan ,  Bokka Abhiram Sai Krishna ,  Keshava Gopal Goud Cheruku

IPC: G06F17/50 ,  G01R31/3177 ,  G06F11/25

Abstract: Monitoring signals in an integrated circuit can include monitoring a probed signal of an integrated circuit using a logic analyzer circuit implemented within the integrated circuit, detecting state changes in the probed signal using the logic analyzer circuit, and generating, within the logic analyzer circuit, a file specifying time stamped state changes of the probed signal.