公开(公告)号：US20190026416A1

公开(公告)日：2019-01-24

申请号：US15658086

申请日：2017-07-24

Applicant: Xilinx, Inc.

Inventor： Akhilesh Mahajan ,  Bokka Abhiram Sai Krishna ,  Keshava Gopal Goud Cheruku

IPC: G06F17/50

CPC classification number: G06F17/5031 ,  G01R31/3177 ,  G06F11/25

Abstract: Monitoring signals in an integrated circuit can include monitoring a probed signal of an integrated circuit using a logic analyzer circuit implemented within the integrated circuit, detecting state changes in the probed signal using the logic analyzer circuit, and generating, within the logic analyzer circuit, a file specifying time stamped state changes of the probed signal.

公开(公告)号：US10482205B2

公开(公告)日：2019-11-19

申请号：US15658086

申请日：2017-07-24

Applicant: Xilinx, Inc.

Inventor： Akhilesh Mahajan ,  Bokka Abhiram Sai Krishna ,  Keshava Gopal Goud Cheruku

IPC: G06F17/50 ,  G01R31/3177 ,  G06F11/25

Abstract: Monitoring signals in an integrated circuit can include monitoring a probed signal of an integrated circuit using a logic analyzer circuit implemented within the integrated circuit, detecting state changes in the probed signal using the logic analyzer circuit, and generating, within the logic analyzer circuit, a file specifying time stamped state changes of the probed signal.