摘要:
This invention provides an apparatus and method for preamble detection and integer carrier frequency offset estimation, which method comprises the steps of: determining the window of useful subcarriers in preamble transformed to frequency domain based on pre-determined possible integer carrier frequency offset and the length of the preamble, so as to select the useful subcarriers; extracting a plurality of subcarrier sequences having a length equal to that of the preamble from the useful subcarriers; calculating conjugative multiplications of each subcarrier and its neighboring subcarriers in the subcarrier sequences extracted; acquiring the real part of the conjugative multiplications; calculating the cross correlations between the real part of the conjugative multiplications and known preambles modulated by DBPSK, and outputting the calculated correlation values; and detecting preamble index of a target base station with the calculated correlation values to select a target cell, and estimating integer carrier frequency offset with respect to the target base station.
摘要:
The present invention relates to an apparatus and method of frame synchronization in broad band wireless communication systems. In an apparatus of frame synchronization in a mobile station, a time variant phase rotation compensator eliminates time variant phase rotation carried in received signals by conjugated multiplication between adjacent signal samples. Then, the processed signal is fed into a delay correlator to calculate a plurality of correlations between two successive frames. A local power calculator acquires an average power of several symbols centered on delayed correlation values. A normalizer normalizes the delayed correlation values with a local average power corresponding to the delayed correlation values. A maximum value detector selects the maximum value from normalized correlation values to trigger frame synchronizing and timing signals.
摘要:
The present invention relates to an apparatus and method of frame synchronization in broad band wireless communication systems. In an apparatus of frame synchronization in a mobile station, a time variant phase rotation compensator eliminates time variant phase rotation carried in received signals by conjugated multiplication between adjacent signal samples. Then, the processed signal is fed into a delay correlator to calculate a plurality of correlations between two successive frames. A local power calculator acquires an average power of several symbols centered on delayed correlation values. A normalizer normalizes the delayed correlation values with a local average power corresponding to the delayed correlation values. A maximum value detector selects the maximum value from normalized correlation values to trigger frame synchronizing and timing signals.
摘要:
This invention provides an apparatus and method for preamble detection and integer carrier frequency offset estimation, which method comprises the steps of: determining the window of useful subcarriers in preamble transformed to frequency domain based on pre-determined possible integer carrier frequency offset and the length of the preamble, so as to select the useful subcarriers; extracting a plurality of subcarrier sequences having a length equal to that of the preamble from the useful subcarriers; calculating conjugative multiplications of each subcarrier and its neighboring subcarriers in the subcarrier sequences extracted; acquiring the real part of the conjugative multiplications; calculating the cross correlations between the real part of the conjugative multiplications and known preambles modulated by DBPSK, and outputting the calculated correlation values; and detecting preamble index of a target base station with the calculated correlation values to select a target cell, and estimating integer carrier frequency offset with respect to the target base station.
摘要:
A printing apparatus which communicates with a data providing apparatus includes a printing mechanism which executes a printing operation. The printing apparatus receives a number of print copies, and acquires print data from the data providing apparatus by executing a request processing of transmitting to the data providing apparatus a data request of the print data, and a reception processing of receiving the print data from the data providing apparatus. When executing a printing operation of N copies (N is an integer of 2 or larger), the acquiring executes, for each copy, the request processing and the reception processing to acquire the print data from the data providing apparatus while executing the request processing of the print data of M-th copy (M is an integer of 2 or larger and N or smaller) after the reception processing of the print data of (M−1)-th copy is completed.
摘要:
The invention provides a crystal of 2-(3,4-dichlorobenzyl)-5-methyl-4-oxo-3,4-dihydrothieno[2,3-d]pyrimidine-6-carboxylic acid (which has the chemical structure shown below) and a mixed crystal comprising such a crystal. The invention also provides methods of producing such crystals, pharmaceutical compositions comprising such crystals, and methods of modulating phosphodiesterase-9 activity and treating disorders such as overactive bladder syndrome by administration of an effective amount of the crystals.
摘要:
In accordance with an embodiment, a defect inspection apparatus includes a charged beam irradiation unit, a detection unit, an energy filter, and an inspection unit. The charged beam irradiation unit generates a charged beam and irradiates a sample including a pattern as an inspection target thereon with the generated charged beam. The detection unit detects secondary charged particles or reflected charged particles generated from the sample by irradiation of the charged beam and outputs a signal. The energy filter is arranged between the detection unit and the sample to selectively allow the secondary charged particles or the reflected charged particles with energy associated with an applied voltage to pass therethrough. The inspection unit applies voltages different from each other to the energy filter and outputs information concerning a defect of the pattern from an intensity difference between signals obtained under application voltage different from each other.
摘要:
Crystals are obtained by heating an aqueous suspension of 2-(3,4-dichlorobenzyl)-5-methyl-4-oxo-3,4-dihydrothieno[2,3-d]pyrimidine-6-carboxylic acid. Novel crystals are obtained by adjusting the heating temperature and/or duration.
摘要:
An ink ribbon cassette includes first and second rotatable bodies that rotate with an ink ribbon held between the rotatable bodies in sandwiched relation. The second rotatable body includes a hole through which a shaft extends such that the second rotatable body is rotatably supported on the shaft. The shaft may have a circumferential surface conical toward the free end, and the hole may be a conical hole into which the conical shaft extends. The shaft may include a plurality of cylindrical shaft portions that are in line with one another and that have different diameters. The second rotatable body is formed with a plurality of cylindrical hole portions having different diameters corresponding to the cylindrical shaft portions such that the second rotatable body is rotatably supported on the shaft.
摘要:
A semiconductor substrate inspection method includes: generating a charged particle beam, and irradiating the charged particle beam to a semiconductor substrate in which contact wiring lines are formed on a surface thereof, the contact wiring lines of the semiconductor substrate being designed to alternately repeat in a plane view so that one of the adjacent contact wiring lines is grounded to the semiconductor substrate and the other of the adjacent contact wiring lines is insulated from the semiconductor substrate; detecting at least one of a secondary charged particle, a reflected charged particle and a back scattering charged particle generated from the surface of the semiconductor substrate to acquire a signal; generating an inspection image with the signal, the inspection image showing a state of the surface of the semiconductor substrate; and judging whether the semiconductor substrate is good or bad from a difference of brightness in the inspection image obtained from the surfaces of the adjacent contact wiring lines.