公开(公告)号：US20090121726A1

公开(公告)日：2009-05-14

申请号：US12233614

申请日：2008-09-19

Applicant: YOSHIHIRO HASHIMOTO

Inventor： YOSHIHIRO HASHIMOTO

IPC: G01R31/28 ,  G01R19/00

CPC classification number: G01R31/31721

Abstract: There is provided a test apparatus for testing a device under test, which includes a voltage supplying section that supplies a voltage to the device under test through a wire, a first capacitor that is arranged between the wire and a common potential in series, a current detecting section that detects a current flowing through the wire at a location closer to the device under test than the first capacitor is, an integrating section that outputs an integration value obtained by integrating a difference between the current detected by the current detecting section and a predetermined reference current, and a judging section that judges whether the device under test is a pass or a failure based on the integration value.

Abstract translation: 提供了一种用于测试被测器件的测试装置，该测试装置包括通过导线向被测器件提供电压的电压提供部分，布置在导线和串联的公共电位之间的第一电容器，电流 检测部，其检测在比所述第一电容器更靠近被测设备的位置处流过所述导线的电流;积分部，其输出通过将由所述电流检测部检测出的电流与预定的电流之间的差积分而得到的积分值 参考电流，以及判断部，根据积分值判断被测设备是通过还是故障。

公开(公告)号：US20110012622A1

公开(公告)日：2011-01-20

申请号：US12502946

申请日：2009-07-14

Applicant: YOSHIHIRO HASHIMOTO

Inventor： YOSHIHIRO HASHIMOTO

IPC: G01R27/26

CPC classification number: G01R31/3004

Abstract: Provided is a test apparatus that tests a device under test, comprising a power supply that generates supply power supplied to the device under test; a transmission path that transmits the supply power generated by the power supply to the device under test; a high-capacitance capacitor that is provided between the transmission path and a ground potential; a low-capacitance capacitor that has a lower capacitance than the high-capacitance capacitor and that is provided between the transmission path and the ground potential at a position closer to the device under test than the high-capacitance capacitor is to the device under test; an intermediate capacitor that is provided between the transmission path and the ground potential at a position between the high-capacitance capacitor and the low-capacitance capacitor; and a current measuring section that measures current flowing through the transmission path between the intermediate capacitor and the low-capacitance capacitor.

Abstract translation: 提供了一种测试被测设备的测试设备，包括产生供应给被测设备的电源的电源; 传输路径，将由电源产生的供电电力传送到被测设备; 设置在传输路径和地电位之间的高容量电容器; 低容量电容器具有比大容量电容器更低的电容，并且在距离被测器件更靠近被测器件的位置处的传输路径和接地电位之间被设置在被测器件上; 中间电容器，设置在所述高电容电容器和所述低容量电容器之间的位置处的所述传输路径与所述接地电位之间; 以及电流测量部，其测量流过中间电容器和低容量电容器之间的传输路径的电流。

公开(公告)号：US20090289609A1

公开(公告)日：2009-11-26

申请号：US12267621

申请日：2008-11-10

Applicant: YOSHIHIRO HASHIMOTO

Inventor： YOSHIHIRO HASHIMOTO

IPC: G05F1/10

CPC classification number: G01R31/31721 ,  G01R31/3004 ,  G01R31/31917

Abstract: Provided is a power supply apparatus including a low pass filter that receives an output voltage of a current output section and allows a low frequency component with a frequency lower than a preset cutoff frequency to pass through; an excess voltage restricting load section that consumes an excess voltage restricting current, which is at least a portion of the output current from the current output section, when a load is turned on; and an excess voltage restricting control section that keeps the excess voltage restricting load section turned off when the output voltage of the current output section is less than an upper reference voltage, which is obtained by adding together a voltage output by the low pass filter and a preset upper offset voltage.

Abstract translation: 提供一种电源装置，包括：低通滤波器，其接收电流输出部的输出电压，并允许具有低于预设截止频率的频率的低频分量通过; 当负载接通时，过电压限制负载部分消耗作为来自电流输出部的输出电流的至少一部分的过剩电压限制电流; 以及过电压限制控制部，其在所述电流输出部的输出电压小于通过将由所述低通滤波器输出的电压加在一起而获得的上参考电压时，使所述过电压限制负载部分截止， 预设上偏移电压。

公开(公告)号：US20090021239A1

公开(公告)日：2009-01-22

申请号：US11755746

申请日：2008-07-30

Applicant: YOSHIHIRO HASHIMOTO

Inventor： YOSHIHIRO HASHIMOTO

IPC: G01R19/00

CPC classification number: G01R31/31924 ,  G01R19/0092 ,  G01R31/3008

Abstract: There is provided a current measuring apparatus that measures an electric current received by an electronic device from an input terminal, The current measuring apparatus includes a first voltage accumulator that accumulates a reference supply voltage that acts as a reference for a voltage being supplied to the electronic device during measuring electric currents, a first switch that connects a power supply to the first voltage accumulator to accumulate the reference supply voltage before measuring electric currents and disconnects the power supply from the first voltage accumulator during measuring electric currents, a current supplying section that supplies an electric current based on the reference supply voltage accumulated in the first voltage accumulator and a terminal voltage of the input terminal to the electronic device during measuring electric currents, and a first current measuring section that measures the supply current supplied to the electronic device.

Abstract translation: 提供了一种电流测量装置，其从输入端子测量由电子设备接收的电流。电流测量装置包括第一蓄电池，其累积作为供给电子装置的电压的基准的参考电源电压 测量电流期间的第一开关，第一开关，其将电源连接到所述第一蓄电池，以在测量电流之前累积参考电源电压，并在测量电流期间断开所述电源与所述第一蓄电器的电源;供电部， 在测量电流期间基于累积在第一蓄电池中的参考电源电压的电流和电子装置的输入端子的端子电压，以及测量供应给电子装置的电源电流的第一电流测量部。

公开(公告)号：US20090121725A1

公开(公告)日：2009-05-14

申请号：US11936799

申请日：2007-11-08

Applicant: YOSHIHIRO HASHIMOTO

Inventor： YOSHIHIRO HASHIMOTO

IPC: G01R31/02

CPC classification number: G01R31/31721

Abstract: There is provided a test apparatus for testing a device under test, which includes a voltage supplying section which supplies a voltage to the device under test through a wire, a first capacitor which is arranged between the wire and a common potential in series, a current detecting section which detects a current flowing through the wire at a location closer to the device under test than the first capacitor is, an integrating section which outputs an integration value obtained by integrating a difference between the current detected by the current detecting section and a predetermined reference current, and a judging section which judges whether the device under test is a pass or a failure based on the integration value.

Abstract translation: 提供了一种用于测试被测器件的测试装置，其包括通过导线向被测器件提供电压的电压提供部分，布置在线和公共电位串联的第一电容器，电流 检测部分，其检测在比所述第一电容器更靠近被测器件的位置处流过所述线的电流;积分部，其输出通过将由所述电流检测部检测到的电流与预定的电流之间的差积分而得到的积分值 参考电流，以及判断部，根据积分值判定被测设备是通过还是故障。