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公开(公告)号:US5929475A
公开(公告)日:1999-07-27
申请号:US573134
申请日:1995-12-15
申请人: Yasuhiro Uemoto , Eigi Fujii , Koji Arita , Yoshihisa Nagano , Yasuhiro Shimada , Masamichi Azuma , Atsuo Inoue , Yasufumi Izutsu
发明人: Yasuhiro Uemoto , Eigi Fujii , Koji Arita , Yoshihisa Nagano , Yasuhiro Shimada , Masamichi Azuma , Atsuo Inoue , Yasufumi Izutsu
IPC分类号: H01L21/02 , H01L21/314 , H01L27/115 , H01L29/76 , H01L27/108 , H01L31/062
CPC分类号: H01L27/11502 , H01L28/40 , H01L28/56
摘要: A method for fabricating a capacitor for an integrated circuit, comprising the steps of forming a titanium film for an adhesion layer over a substrate, forming a titanium dioxide film for a diffusion barrier layer by annealing the titanium film after ion-implantation of oxygen ion into a surface region of the titanium film so as to change titanium in the surface region to titanium dioxide, and forming a high dielectric constant capacitor on the titanium dioxide film.
摘要翻译: 一种用于制造用于集成电路的电容器的方法,包括以下步骤:在衬底上形成用于粘附层的钛膜,通过在离子注入氧离子之后将钛膜退火形成用于扩散阻挡层的二氧化钛膜 钛膜的表面区域,以将表面区域中的钛变为二氧化钛,并在二氧化钛膜上形成高介电常数电容器。
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公开(公告)号:US06214660B1
公开(公告)日:2001-04-10
申请号:US09177620
申请日:1998-10-23
申请人: Yasuhiro Uemoto , Eigi Fujii , Koji Arita , Yoshihisa Nagano , Yasuhiro Shimada , Masamichi Azuma , Atsuo Inoue , Yasufumi Izutsu
发明人: Yasuhiro Uemoto , Eigi Fujii , Koji Arita , Yoshihisa Nagano , Yasuhiro Shimada , Masamichi Azuma , Atsuo Inoue , Yasufumi Izutsu
IPC分类号: H01L213205
CPC分类号: H01L27/11502 , H01L28/40 , H01L28/56
摘要: A method for fabricating a capacitor for an integrated circuit, comprising the steps of forming a titanium film for an adhesion layer over a substrate, forming a titanium dioxide film for a diffusion barrier layer by annealing the titanium film after ion-implantation of oxygen ion into a surface region of the titanium film so as to change titanium in the surface region to titanium dioxide, and forming a high dielectric constant capacitor on the titanium dioxide film.
摘要翻译: 一种用于制造用于集成电路的电容器的方法,包括以下步骤:在衬底上形成用于粘附层的钛膜,通过在离子注入氧离子之后将钛膜退火形成用于扩散阻挡层的二氧化钛膜 钛膜的表面区域,以将表面区域中的钛变为二氧化钛,并在二氧化钛膜上形成高介电常数电容器。
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