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    Method and system for scan chain diagnosis
    1.
    发明授权
    Method and system for scan chain diagnosis 有权
    扫描链诊断方法与系统

    公开(公告)号：US08689070B2

    公开(公告)日：2014-04-01

    申请号：US12781695

    申请日：2010-05-17

    申请人： Yu Huang ,  Wu-Tung Cheng ,  Ruifeng Guo ,  Ting-Pu Tai

    发明人： Yu Huang ,  Wu-Tung Cheng ,  Ruifeng Guo ,  Ting-Pu Tai

    IPC分类号： G06F11/00

    CPC分类号： G01R31/318544 ,  G01R31/318547 ,  G06F11/2215

    摘要： Scan chain diagnosis techniques are disclosed. Faulty scan chains are modeled and scan patterns are masked to filter out loading-caused failures. By simulating the masked scan patterns, failing probabilities are determined for cells on a faulty scan chain. One or more defective cells are identified based upon the failing probability information. A noise filtering system such as the one based upon adaptive feedback may be adopted for the identification process.

    摘要翻译： 公开扫描链诊断技术。 对扫描链进行建模和扫描模式被屏蔽，以过滤掉加载引起的故障。 通过模拟掩蔽的扫描模式，确定故障扫描链上的单元的故障概率。 基于故障概率信息来识别一个或多个有缺陷的小区。 可以采用诸如基于自适应反馈的噪声滤波系统来进行识别处理。

    Compound hold-time fault diagnosis
    2.
    发明授权
    Compound hold-time fault diagnosis 有权
    复合保持时间故障诊断

    公开(公告)号：US08862956B2

    公开(公告)日：2014-10-14

    申请号：US13397594

    申请日：2012-02-15

    申请人： Yu Huang ,  Wu-Tung Cheng ,  Ting-Pu Tai ,  Liyang Lai ,  Ruifeng Guo

    发明人： Yu Huang ,  Wu-Tung Cheng ,  Ting-Pu Tai ,  Liyang Lai ,  Ruifeng Guo

    IPC分类号： G01R31/28 ,  G01R31/3185 ,  G06F11/267 ,  G01R31/3177 ,  G06F11/27

    CPC分类号： G01R31/318594 ,  G01R31/3177 ,  G01R31/318541 ,  G06F11/267 ,  G06F11/27

    摘要： Aspects of the invention relate to techniques for diagnosing compound hold-time faults. A profiling-based scan chain diagnosis may be performed on a faulty scan chain to determine observed scan cell failing probability information and one or more faulty segments based on scan pattern test information. Calculated scan cell failing probability information may then be derived. Based on the calculated scan cell failing probability information and the observed scan cell failing probability information, one or more validated faulty segments are verified to have one or more compound hold-time faults. Finally, one or more clock defect suspects may be identified based on information of the one or more validated faulty segments.

    摘要翻译： 本发明的方面涉及用于诊断复合保持时间故障的技术。 可以在故障扫描链上执行基于分析的扫描链诊断，以基于扫描模式测试信息来确定观察到的扫描单元故障概率信息和一个或多个故障段。 然后可以导出计算的扫描单元故障概率信息。 基于计算的扫描单元故障概率信息和观察到的扫描单元故障概率信息，验证一个或多个经验证的故障段具有一个或多个复合保持时间故障。 最后，可以基于一个或多个经验证的故障段的信息来识别一个或多个时钟缺陷嫌疑犯。

    Compound Hold-Time Fault Diagnosis
    3.
    发明申请
    Compound Hold-Time Fault Diagnosis 有权
    复合保持时间故障诊断

    公开(公告)号：US20120210184A1

    公开(公告)日：2012-08-16

    申请号：US13397594

    申请日：2012-02-15

    申请人： Yu Huang ,  Wu-Tung Cheng ,  Ting-Pu Tai ,  Liyang Lai ,  Ruifeng Guo

    发明人： Yu Huang ,  Wu-Tung Cheng ,  Ting-Pu Tai ,  Liyang Lai ,  Ruifeng Guo

    IPC分类号： G01R31/3177 ,  G06F11/25

    CPC分类号： G01R31/318594 ,  G01R31/3177 ,  G01R31/318541 ,  G06F11/267 ,  G06F11/27

    摘要： Aspects of the invention relate to techniques for diagnosing compound hold-time faults. A profiling-based scan chain diagnosis may be performed on a faulty scan chain to determine observed scan cell failing probability information and one or more faulty segments based on scan pattern test information. Calculated scan cell failing probability information may then be derived. Based on the calculated scan cell failing probability information and the observed scan cell failing probability information, one or more validated faulty segments are verified to have one or more compound hold-time faults. Finally, one or more clock defect suspects may be identified based on information of the one or more validated faulty segments.

    摘要翻译： 本发明的方面涉及用于诊断复合保持时间故障的技术。 可以在故障扫描链上执行基于分析的扫描链诊断，以基于扫描模式测试信息来确定观察到的扫描单元故障概率信息和一个或多个故障段。 然后可以导出计算的扫描单元故障概率信息。 基于计算的扫描单元故障概率信息和观察到的扫描单元故障概率信息，验证一个或多个经验证的故障段具有一个或多个复合保持时间故障。 最后，可以基于一个或多个经验证的故障段的信息来识别一个或多个时钟缺陷嫌疑犯。

    Method And System For Scan Chain Diagnosis
    4.
    发明申请
    Method And System For Scan Chain Diagnosis 有权
    扫描链诊断方法与系统

    公开(公告)号：US20100293422A1

    公开(公告)日：2010-11-18

    申请号：US12781695

    申请日：2010-05-17

    申请人： Yu Huang ,  Wu-Tung Cheng ,  Ruifeng Guo ,  Ting-Pu Tai

    发明人： Yu Huang ,  Wu-Tung Cheng ,  Ruifeng Guo ,  Ting-Pu Tai

    IPC分类号： G01R31/3177 ,  G06F11/25

    CPC分类号： G01R31/318544 ,  G01R31/318547 ,  G06F11/2215

    摘要： Scan chain diagnosis techniques are disclosed. Faulty scan chains are modeled and scan patterns are masked to filter out loading-caused failures. By simulating the masked scan patterns, failing probabilities are determined for cells on a faulty scan chain. One or more defective cells are identified based upon the failing probability information. A noise filtering system such as the one based upon adaptive feedback may be adopted for the identification process.

    摘要翻译： 公开扫描链诊断技术。 对扫描链进行建模和扫描模式被屏蔽，以过滤掉加载引起的故障。 通过模拟掩蔽的扫描模式，确定故障扫描链上的单元的故障概率。 基于故障概率信息来识别一个或多个有缺陷的小区。 可以采用诸如基于自适应反馈的噪声滤波系统来进行识别处理。

    Generating test sets for diagnosing scan chain failures
    5.
    发明授权
    Generating test sets for diagnosing scan chain failures 有权
    生成用于诊断扫描链故障的测试集

    公开(公告)号：US08935582B2

    公开(公告)日：2015-01-13

    申请号：US13460407

    申请日：2012-04-30

    申请人： Ruifeng Guo ,  Yu Huang ,  Wu-Tung Cheng

    发明人： Ruifeng Guo ,  Yu Huang ,  Wu-Tung Cheng

    IPC分类号： G01R31/28 ,  G01R31/3185

    CPC分类号： G01R31/3177 ,  G01R31/318525 ,  G01R31/31853 ,  G01R31/318533 ,  G01R31/318544 ,  G01R31/318569

    摘要： Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.

    摘要翻译： 所公开的技术的实施例包括可用于改进扫描链测试模式生成和扫描链故障诊断解析的基于软件的技术。 例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。 这样的实施例可用于产生“完整”测试集，即，能够将故障扫描链中的任何扫描链缺陷分离到单个扫描单元的一组链诊断测试模式。

    Fault dictionary-based scan chain failure diagnosis
    6.
    发明授权
    Fault dictionary-based scan chain failure diagnosis 有权
    基于故障字典的扫描链故障诊断

    公开(公告)号：US08615695B2

    公开(公告)日：2013-12-24

    申请号：US11818440

    申请日：2007-06-13

    申请人： Ruifeng Guo ,  Yu Huang ,  Wu-Tung Cheng

    发明人： Ruifeng Guo ,  Yu Huang ,  Wu-Tung Cheng

    IPC分类号： G01R31/28 ,  G06F11/00

    CPC分类号： G01R31/3177 ,  G01R31/318525 ,  G01R31/318541

    摘要： A dictionary-based scan chain fault detector includes a dictionary with fault signatures computed for scan cells in the scan chain. Entries in the fault dictionary are compared with failures in the failure log to identify a faulty scan cell. In one embodiment a single fault in a scan chain is identified. In another embodiment, a last fault and a first fault in a scan chain are identified.

    摘要翻译： 基于字典的扫描链故障检测器包括为扫描链中的扫描单元计算的具有故障签名的字典。 将故障字典中的条目与故障日志中的故障进行比较，以识别故障扫描单元。 在一个实施例中，识别扫描链中的单个故障。 在另一个实施例中，识别扫描链中的最后故障和第一故障。

    Generating test sets for diagnosing scan chain failures
    8.
    发明授权
    Generating test sets for diagnosing scan chain failures 有权
    生成用于诊断扫描链失败的测试集

    公开(公告)号：US08261142B2

    公开(公告)日：2012-09-04

    申请号：US12074162

    申请日：2008-02-29

    申请人： Ruifeng Guo ,  Yu Huang ,  Wu-Tung Cheng

    发明人： Ruifeng Guo ,  Yu Huang ,  Wu-Tung Cheng

    IPC分类号： G01R31/28

    CPC分类号： G01R31/3177 ,  G01R31/318525 ,  G01R31/31853 ,  G01R31/318533 ,  G01R31/318544 ,  G01R31/318569

    摘要： Embodiments of the disclosed technology comprise software-based techniques that can be used to improve scan chain test pattern generation and scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. Such embodiments can be used to generate a “complete” test set—that is, a set of chain diagnosis test patterns that is able to isolate any scan chain defect in a faulty scan chain to a single scan cell.

    摘要翻译： 所公开技术的实施例包括可用于改进扫描链测试模式生成和扫描链故障诊断解析的基于软件的技术。 例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。 这样的实施例可以用于产生“完整”测试集，即，能够将故障扫描链中的任何扫描链缺陷分离到单个扫描单元的一组链诊断测试模式。

    Diagnosing mixed scan chain and system logic defects
    9.
    发明授权
    Diagnosing mixed scan chain and system logic defects 有权
    诊断混合扫描链和系统逻辑缺陷

    公开(公告)号：US07788561B2

    公开(公告)日：2010-08-31

    申请号：US11838858

    申请日：2007-08-14

    申请人： Yu Huang ,  Wu-Tung Cheng ,  Ruifeng Guo

    发明人： Yu Huang ,  Wu-Tung Cheng ,  Ruifeng Guo

    IPC分类号： G01R31/28

    CPC分类号： G01R31/318569

    摘要： Technologies disclosed herein can be used to diagnose defects on die having both scan chain and system logic defects, including in situations where the presence of one or more faults in the system logic potentially obscures the detectability of one or more faults in the scan chains (or channels) and vice versa. At least some embodiments employ an iterative approach where at least some scan chain faults are identified, these chain faults are used to identify system logic faults, and then additional chain faults are identified using the system logic faults and vice versa. Failing bits can be partitioned into at least two groups: failing bits determined as being caused by system logic failures, and failing bits determined as being possibly caused by chain defects, system logic defects, or the compound effects of both types of defects.

    摘要翻译： 本文公开的技术可用于诊断具有扫描链和系统逻辑缺陷的裸片上的缺陷，包括在系统逻辑中存在一个或多个故障潜在地掩盖扫描链中的一个或多个故障的可检测性的情况下（或 频道），反之亦然。 至少一些实施例采用迭代方法，其中识别出至少一些扫描链故障，这些链故障用于识别系统逻辑故障，然后使用系统逻辑故障来识别附加链故障，反之亦然。 失败的位可被划分为至少两组：确定为由系统逻辑故障引起的故障位，以及确定为可能由链缺陷，系统逻辑缺陷或两种类型的缺陷的复合效应引起的故障位。

    TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES
    10.
    发明申请
    TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES 有权
    用于诊断扫描链失败的测试图形生成

    公开(公告)号：US20090235134A1

    公开(公告)日：2009-09-17

    申请号：US12471227

    申请日：2009-05-22

    申请人： Ruifeng Guo ,  Wu-Tung Cheng ,  Yu Huang

    发明人： Ruifeng Guo ,  Wu-Tung Cheng ,  Yu Huang

    IPC分类号： G01R31/3177 ,  G06F11/25 ,  G06F15/16

    CPC分类号： G01R31/318544

    摘要： Embodiments of the disclosed technology comprise techniques that can be used to generate scan chain test patterns and improve scan chain failure diagnosis resolution. For example, certain embodiments can be used to generate high quality chain diagnosis test patterns that are able to isolate a scan chain defect to a single scan cell. At least some embodiments can be used to locate faults over multiple capture cycles in the scan chain.

    摘要翻译： 所公开技术的实施例包括可用于产生扫描链测试模式并提高扫描链故障诊断分辨率的技术。 例如，某些实施例可用于产生能够将扫描链缺陷隔离成单个扫描单元的高质量链诊断测试图案。 至少一些实施例可用于在扫描链中的多个捕获周期上定位故障。