Barrier Detection for Support Structures

    公开(公告)号:US20220130050A1

    公开(公告)日:2022-04-28

    申请号:US17081412

    申请日:2020-10-27

    Abstract: A method of barrier detection in an imaging controller includes: obtaining an image of a support structure configured to support a plurality of items on a support surface extending between a shelf edge and a shelf back; extracting frequency components representing pixels of the image; based on the extracted frequency components, identifying a barrier region of the image, the barrier region containing a barrier adjacent to the shelf edge; and detecting at least one empty sub-region within the barrier region, wherein the empty sub-region is free of items between the barrier and the shelf back.

    Method, System and Apparatus for Depth Sensor Artifact Removal

    公开(公告)号:US20200380709A1

    公开(公告)日:2020-12-03

    申请号:US16429523

    申请日:2019-06-03

    Abstract: A method in an imaging controller of detecting depth sensor artifacts includes: obtaining, from first and second sensors, first and second pluralities of points defined by respective (i) planar positions and depths in a common frame of reference, and (ii) scan angles relative to field of view centers of the first or second sensors; for each of a subset of candidate points from the first plurality of points: searching the second plurality of points for a validator point having (i) a planar position within a threshold distance of a planar position of the candidate point, and (ii) a scan angle smaller than a scan angle of the candidate point; responsive to identifying the validator point: when the depth of the validator point exceeds the depth of the candidate point, classifying the candidate point as an artifact.

    Method, system and apparatus for depth sensor artifact removal

    公开(公告)号:US11158075B2

    公开(公告)日:2021-10-26

    申请号:US16429523

    申请日:2019-06-03

    Abstract: A method in an imaging controller of detecting depth sensor artifacts includes: obtaining, from first and second sensors, first and second pluralities of points defined by respective (i) planar positions and depths in a common frame of reference, and (ii) scan angles relative to field of view centers of the first or second sensors; for each of a subset of candidate points from the first plurality of points: searching the second plurality of points for a validator point having (i) a planar position within a threshold distance of a planar position of the candidate point, and (ii) a scan angle smaller than a scan angle of the candidate point; responsive to identifying the validator point: when the depth of the validator point exceeds the depth of the candidate point, classifying the candidate point as an artifact.

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