Method, system and apparatus for depth sensor artifact removal

    公开(公告)号:US11158075B2

    公开(公告)日:2021-10-26

    申请号:US16429523

    申请日:2019-06-03

    Abstract: A method in an imaging controller of detecting depth sensor artifacts includes: obtaining, from first and second sensors, first and second pluralities of points defined by respective (i) planar positions and depths in a common frame of reference, and (ii) scan angles relative to field of view centers of the first or second sensors; for each of a subset of candidate points from the first plurality of points: searching the second plurality of points for a validator point having (i) a planar position within a threshold distance of a planar position of the candidate point, and (ii) a scan angle smaller than a scan angle of the candidate point; responsive to identifying the validator point: when the depth of the validator point exceeds the depth of the candidate point, classifying the candidate point as an artifact.

    Method, System and Apparatus for Depth Sensor Artifact Removal

    公开(公告)号:US20200380709A1

    公开(公告)日:2020-12-03

    申请号:US16429523

    申请日:2019-06-03

    Abstract: A method in an imaging controller of detecting depth sensor artifacts includes: obtaining, from first and second sensors, first and second pluralities of points defined by respective (i) planar positions and depths in a common frame of reference, and (ii) scan angles relative to field of view centers of the first or second sensors; for each of a subset of candidate points from the first plurality of points: searching the second plurality of points for a validator point having (i) a planar position within a threshold distance of a planar position of the candidate point, and (ii) a scan angle smaller than a scan angle of the candidate point; responsive to identifying the validator point: when the depth of the validator point exceeds the depth of the candidate point, classifying the candidate point as an artifact.

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