公开(公告)号：US07447784B2

公开(公告)日：2008-11-04

申请号：US10181159

申请日：2001-01-18

申请人： Tak Eun

发明人： Tak Eun

IPC分类号： G06F15/16 ,  G06F15/177 ,  G06F15/173

CPC分类号： H04W12/06 ,  G06F21/43 ,  G06Q20/32 ,  G06Q20/3224 ,  G06Q20/3255 ,  G06Q20/425 ,  G06Q30/0601 ,  H04L63/0853 ,  H04L63/18 ,  H04W4/14

摘要： The present invention discloses an authentication method using a cellular phone in internet. According to the present invention, when connecting to internet or performing electronic commerce, the authentication is performed through the cellular phone in parallel with a personal information stored when user's joining the cellular phone service, a number particular to the cellular phone, a secret number in an authentication required for the connection or the settlement of accounts. Specifically, in authentication process for making up accounts, besides the line connected to internet, a separate cellular phone line is used and if the authentication data of the internet site server is identical to that of the cellular phone service company, the authentication process is completed, thereby eliminating the danger of hacking basically.

摘要翻译： 本发明公开了一种使用互联网中的蜂窝电话的认证方法。 根据本发明，当连接到互联网或执行电子商务时，通过蜂窝电话与用户加入蜂窝电话服务时存储的个人信息，蜂窝电话特有的号码，秘密号码 帐户连接或结算所需的身份验证。 具体来说，在构成帐户的认证处理中，除了连接到互联网的线路之外，还使用单独的蜂窝电话线路，并且如果互联网站点服务器的认证数据与蜂窝电话服务公司的认证数据相同，则认证处理完成 ，从而基本消除了黑客的危险。

公开(公告)号：US07104549B2

公开(公告)日：2006-09-12

申请号：US10456603

申请日：2003-06-06

申请人： Tak Eun ,  Sun-kyu Yang

发明人： Tak Eun ,  Sun-kyu Yang

IPC分类号： A63C1/34

CPC分类号： A63C17/062 ,  A63C17/006 ,  A63C17/0073 ,  A63C17/064 ,  A63C2203/42

摘要： A steerable inline skate which allows user to change direction more easily and reduce the abrasion of wheels to thus lengthen the life of the wheels by allowing front and rear wheels 30 and 50 among a plurality of wheels arranged in a line to be steered within a predetermined angle utilizing the structure of a trapezoidal linkage.

摘要翻译： 一种可转向的直排轮滑，使用户可以更容易地改变方向，减少车轮的磨损，从而延长车轮的使用寿命，方法是使排列在一条直线上的多个车轮中的前后轮30和50能够在预定的范围内转向 角度利用梯形连杆的结构。

公开(公告)号：US11624771B2

公开(公告)日：2023-04-11

申请号：US17690114

申请日：2022-03-09

申请人： Microinspection, Inc.

发明人： Tak Eun ,  Ho Hack Kim ,  Beom Jin Kim ,  Dong Jun Lee

IPC分类号： G01R31/26 ,  G01R1/067 ,  H01L25/075

摘要： The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.

公开(公告)号：US07746086B2

公开(公告)日：2010-06-29

申请号：US11826147

申请日：2007-07-12

申请人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Jong In Park ,  Woo Chul Cho

发明人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Jong In Park ,  Woo Chul Cho

IPC分类号： G01R27/08 ,  G01R31/02

CPC分类号： G01R31/2812 ,  G01R31/025 ,  G01R31/312 ,  G02F2001/136254

摘要： Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.

摘要翻译： 本文公开了一种非接触单侧探针和用于测试图案电极的开路和短路的装置和方法。 通过向每个图形电极的一端供电，并使用包括兴奋剂电极和传感器电极的非接触型单侧探针装置作为单个模块感测电变化值，可以测试图案电极的开路和短路 通过一个扫描过程。 由于使用非接触型单面探针器件对图形电极的开路短路进行了测试，所以可以防止图案电极由于接触不良或加压接触而被损坏，并且探针器件的使用寿命可以比 接触型探针装置。

公开(公告)号：US08072600B2

公开(公告)日：2011-12-06

申请号：US12458183

申请日：2009-07-02

申请人： Tak Eun ,  Seong Jin Kim ,  Dong Jun Lee

发明人： Tak Eun ,  Seong Jin Kim ,  Dong Jun Lee

IPC分类号： G01B11/00

CPC分类号： G01R31/304 ,  G01R31/2874

摘要： An inspection method for a circuit substrate is disclosed, which inspects electrical properties of a circuit substrate having a multilayered structure, by controlling inspection environments so that dew forms on a surface of the circuit substrate and detecting change of states of the dew to thereby determining variation of a thermal capacity of a conductor with respect to defective contacts or vias, micro vias and a circuit pattern of an inner layer. According to this, the inspection can be performed with respect to a wide area simultaneously and therefore the inspection productivity can be improved. In addition, since the temperature of the conductive wire can be measured directly through change of the dew, the cost for the temperature measurement can be saved. Moreover, the cost for an area sensor to sense the temperature of a wide area may be reduced while improving the inspection speed.

摘要翻译： 公开了一种电路基板的检查方法，其通过控制检查环境来检查具有多层结构的电路基板的电特性，从而在电路基板的表面上形成露点并检测露水状态的变化，从而确定变化 相对于缺陷触点或通孔，微通孔和内层的电路图案的导体的热容量。 据此，能够同时进行广泛的检查，能够提高检查生产率。 此外，由于可以通过露水的变化直接测量导线的温度，因此可以节省温度测量的成本。 此外，可以降低用于感测广域的温度的区域传感器的成本，同时提高检查速度。

公开(公告)号：US20080018338A1

公开(公告)日：2008-01-24

申请号：US11826145

申请日：2007-07-12

申请人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

发明人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

IPC分类号： G01R31/14 ,  G01R27/26

CPC分类号： G01R31/024 ,  G01R1/06788

摘要： Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

摘要翻译： 本文公开了一种用于测试导线的开路和短路的装置和方法。 使探针与每个导线的一端接触，施加AC电力，并且使用在探针中测量的电变化来测试导线。 通过使用单面探针装置，可以显着减少PCB图案，数据传输线或电缆的开路或短路测试时的探头数量，并显着减少测试所需的时间或劳动 开路或短路。 由于仅在导线的一端进行测量以测试导线的开路或短路，所以当单侧探针装置安装在输入/输出端口中时，可以自我诊断开路或短路， 电气设备的输出端口。

公开(公告)号：US20220390503A1

公开(公告)日：2022-12-08

申请号：US17690114

申请日：2022-03-09

申请人： Microinspection, Inc.

发明人： Tak EUN ,  Ho Hack Kim ,  Beom Jin Kim ,  Dong Jun Lee

IPC分类号： G01R31/26 ,  G01R1/067

摘要： The present disclosure provides an apparatus for illumination inspection of micro LEDs. An apparatus for illumination inspection of micro LEDs includes a surface-contact probe making a surface contact, through an electrical resistive material, with a front surface of an LED assembly of multiple micro LEDs arranged forwardly and interconnecting LED electrodes at both ends of the micro LEDs, probe electrodes to be in line contact with one side and the other side of the surface-contact probe for supplying electric power, an imaging unit for photographing the LED assembly from an opposite surface of the surface-contact probe, to where the surface-contact probe is contacted, and a control unit for supplying electric power to the probe electrodes forwardly along the micro LEDs as aligned and for inspecting the micro LEDs illumination based on images of the LED assembly photographed by the imaging unit before and after supplying the electric power.

公开(公告)号：US20100002232A1

公开(公告)日：2010-01-07

申请号：US12458183

申请日：2009-07-02

申请人： Tak Eun ,  Seong Jin Kim ,  Dong Jun Lee

发明人： Tak Eun ,  Seong Jin Kim ,  Dong Jun Lee

IPC分类号： G01N21/00

CPC分类号： G01R31/304 ,  G01R31/2874

摘要： An inspection method for a circuit substrate is disclosed, which inspects electrical properties of a circuit substrate having a multilayered structure, by controlling inspection environments so that dew forms on a surface of the circuit substrate and detecting change of states of the dew to thereby determining variation of a thermal capacity of a conductor with respect to defective contacts or vias, micro vias and a circuit pattern of an inner layer. According to this, the inspection can be performed with respect to a wide area simultaneously and therefore the inspection productivity can be improved. In addition, since the temperature of the conductive wire can be measured directly through change of the dew, the cost for the temperature measurement can be saved. Moreover, the cost for an area sensor to sense the temperature of a wide area may be reduced while improving the inspection speed.

摘要翻译： 公开了一种电路基板的检查方法，其通过控制检查环境来检查具有多层结构的电路基板的电特性，从而在电路基板的表面上形成露点并检测露水状态的变化，从而确定变化 相对于缺陷触点或通孔，微通孔和内层的电路图案的导体的热容量。 据此，能够同时进行广泛的检查，能够提高检查生产率。 此外，由于可以通过露水的变化直接测量导线的温度，因此可以节省温度测量的成本。 此外，可以降低用于感测广域的温度的区域传感器的成本，同时提高检查速度。

公开(公告)号：US07629796B2

公开(公告)日：2009-12-08

申请号：US11826145

申请日：2007-07-12

申请人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

发明人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

IPC分类号： G01R15/12

CPC分类号： G01R31/024 ,  G01R1/06788

摘要： Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

摘要翻译： 本文公开了一种用于测试导线的开路和短路的装置和方法。 使探针与每个导线的一端接触，施加AC电力，并且使用在探针中测量的电变化来测试导线。 通过使用单面探针装置，可以显着减少PCB图案，数据传输线或电缆的开路或短路测试时的探针数量，并显着减少测试所需的时间或劳动 开路或短路。 由于仅在导线的一端进行测量以测试导线的开路或短路，所以当单侧探针装置安装在输入/输出端口中时，可以自我诊断开路或短路， 电气设备的输出端口。

公开(公告)号：US20080018339A1

公开(公告)日：2008-01-24

申请号：US11826147

申请日：2007-07-12

申请人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Jong In Park ,  Woo Chul Cho

发明人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Jong In Park ,  Woo Chul Cho

IPC分类号： G01R31/14 ,  G01R27/26

CPC分类号： G01R31/2812 ,  G01R31/025 ,  G01R31/312 ,  G02F2001/136254

摘要： Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.

摘要翻译： 本文公开了一种非接触单侧探针和用于测试图案电极的开路和短路的装置和方法。 通过向每个图形电极的一端供电，并使用包括兴奋剂电极和传感器电极的非接触型单侧探针装置作为单个模块感测电变化值，可以测试图案电极的开路和短路 通过一个扫描过程。 由于使用非接触型单面探针器件对图形电极的开路短路进行了测试，所以可以防止图案电极由于接触不良或加压接触而被损坏，并且探针器件的使用寿命可以比 接触型探针装置。