IMAGING WITH CURVED COMPRESSION ELEMENTS
    1.
    发明公开

    公开(公告)号:US20240341710A1

    公开(公告)日:2024-10-17

    申请号:US18642974

    申请日:2024-04-23

    申请人: Hologic, Inc.

    摘要: A curved compression element, such as a breast compression paddle, and imaging systems and methods for use with curved compression elements. A system may include a radiation source, a detector, and a curved compression element. Operations are performed that include receiving image data from the detector; accessing a correction map for the at least one compression paddle; correcting the image data based on the correction map to generate a corrected image data; and generating an image of the breast based on the corrected image data. The breast compression element generally has no sharp edges, but rather has smooth edges and transitions between surfaces. The breast compression paddle also includes a flexible material that spans a portion of a curved bottom surface of the breast compression paddle to define a gap. The flexible material may be a thin-film material such as a shrink wrap.

    DETERMINATION OF LONGITUDINAL POSITION OF COMBINED PHANTOM

    公开(公告)号:US20240335173A1

    公开(公告)日:2024-10-10

    申请号:US18579951

    申请日:2021-08-27

    IPC分类号: A61B6/03 A61B6/58

    CPC分类号: A61B6/032 A61B6/583

    摘要: A method for determining a longitudinal position of a combined phantom, a computer readable storage medium, and a CT device. The method includes: scanning the combined phantom to obtain a topogram thereof. The combined phantom is fixed to a table top, protrudes beyond the table top, is axially parallel to the longitudinal direction, and includes a plurality of phantoms, one of which is a slice phantom. The method further includes identifying the plurality of phantoms on the topogram, and using an axial center of the slice phantom as the longitudinal position of the combined phantom. The longitudinal position is determined by using the topogram of the combined phantom, and a phantom position is aligned automatically.

    SYSTEMS AND METHODS FOR DETERMINING CORRECTION PARAMETERS FOR IMAGING DEVICES

    公开(公告)号:US20240312062A1

    公开(公告)日:2024-09-19

    申请号:US18674977

    申请日:2024-05-27

    IPC分类号: G06T7/80 A61B6/03 A61B6/58

    摘要: Systems and methods for determining at least one correction parameter for a Positron Emission Tomography (PET) scanner including a plurality of detector units is provided. For each line of response (LOR) of a plurality of lines of response (LORs) associated with the plurality of detector units, the methods may include determining, based on scan data of one or more scans of a phantom at a plurality of positions, a first sum of coincidence events on the LOR, wherein the phantom is moved to the plurality of positions along an axis of a field of view of the PET scanner during the one or more scans, and a length of the phantom is less than a length of the field of view of the PET scanner along the axis; determining, based on the first sum of coincidence events, at least one correction parameter associated with the LOR.

    NORMALIZATION CORRECTION METHOD AND APPARATUS FOR PET SYSTEM, AND DEVICE AND READABLE STORAGE MEDIUM

    公开(公告)号:US20240268772A1

    公开(公告)日:2024-08-15

    申请号:US18568389

    申请日:2021-06-08

    IPC分类号: A61B6/03 A61B6/42 A61B6/58

    摘要: Provided is a normalization correction method for a PET system a detector including crystals. The method includes: obtaining a coincidence event dataset including a plurality of lines of response; calculating a geometric symmetry value of each line of response; grouping the plurality of lines of response according to the geometric symmetry value, where a plurality of lines of response in a group have a same geometric symmetry value; calculating a number of coincidence events of a same group through accumulation; cyclically calculating, according to the calculated number of the coincidence events for the same group, a geometric factor value of each group, where each line of response in the same group of lines of response has a same geometric factor value; cyclically calculating crystal efficiency factor values of the crystals; and calculating normalization factor values of the lines of response respectively, according to the geometric factor value and the crystal efficiency factor values.