METHODS AND APPARATUS TO TRIM TEMPERATURE SENSORS

    公开(公告)号:US20230349774A1

    公开(公告)日:2023-11-02

    申请号:US18206684

    申请日:2023-06-07

    IPC分类号: G01K15/00 G01K7/16 G05B11/01

    摘要: Methods, apparatus, systems and articles of manufacture to trim temperature sensors are disclosed. An example method includes: sampling a first value indicative of a temperature of a first die of a multi-chip module (MCM) with a first temperature sensor, the first die including a first transistor having a channel including a first material; and calibrating a second temperature sensor configured to sample a second value indicative of a temperature of a second die including a second transistor have a second channel including a second material, the calibrating based on the first value.