利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

3 条记录 (耗时 0.009 秒)

    Method for characterising the profile of a surface
    1.
    发明授权
    Method for characterising the profile of a surface 有权
    表征曲面轮廓的方法

    公开(公告)号：US08326573B2

    公开(公告)日：2012-12-04

    申请号：US12310195

    申请日：2007-06-21

    申请人： Andrew D Jackson ,  Peter I Wright ,  Michael A Howard ,  Robert J Stafford

    发明人： Andrew D Jackson ,  Peter I Wright ,  Michael A Howard ,  Robert J Stafford

    IPC分类号： G01B7/28

    CPC分类号： G01B21/20 ,  F05D2250/74 ,  G05B19/4099 ,  G05B2219/34145 ,  G05B2219/35016 ,  G05B2219/35128 ,  G05B2219/35131 ,  G05B2219/35193 ,  G05B2219/37064 ,  G05B2219/45147 ,  Y02P90/265 ,  Y02T50/673

    摘要： A method for characterising the surface profile of a component comprises the steps of a) dividing the surface into at least two regions; b) for each region, measuring the surface and selecting a number of measured points to define a co-ordinate dataset for the region; c) for each region, applying a curve-fitting algorithm to the dataset for the region to define the surface profile of the region; d) combining the defined surface profiles for the regions to produce a defined surface profile for the aerofoil surface. The characterization may be used in the design, analysis and manufacturing steps of product development, thereby decreasing the total time and work required.

    摘要翻译： 用于表征部件的表面轮廓的方法包括以下步骤：a）将所述表面分成至少两个区域; b）对于每个区域，测量表面并选择一些测量点以定义该区域的坐标数据集; c）对于每个区域，对区域的数据集应用曲线拟合算法来定义区域的表面轮廓; d）组合用于区域的限定的表面轮廓以产生用于机翼表面的限定的表面轮廓。 特征描述可用于产品开发的设计，分析和制造步骤，从而减少所需的总时间和工作。

    Method and apparatus for numerically controlled probing
    3.
    发明授权
    Method and apparatus for numerically controlled probing 失效
    用于数控探测的方法和装置

    公开(公告)号：US5796619A

    公开(公告)日：1998-08-18

    申请号：US602257

    申请日：1996-02-15

    申请人： Robert R. Wampler

    发明人： Robert R. Wampler

    IPC分类号： G05B19/41 ,  G06F19/00

    CPC分类号： G05B19/41 ,  G05B2219/35131 ,  G05B2219/37043 ,  G05B2219/49344

    摘要： A probing system used for determining a measured set of dimensions of at least one feature of an object. The system comprises an input device that receives an ideal set of dimension of the at least one feature. The input device generates a first signal indicative of an amount and location of sample measurements taken of the at least one feature. The system also comprises a probe device, which is electrically connected to the input device. The probe device receives the first signal from the input device, and in response directs a probe to the location of the measurements to be taken for each of the amount of sample measurements indicated. The probe device outputs a second signal indicative of a measured location for each of the amount of samples taken. The system further comprises a processor electrically connected to the probe device. The processor receives the second signal indicative of the measured locations of each of the samples taken, and rotates the measured locations about a single sample so all samples can be represented as a point lying on a two dimensional plane. Further, the processor uses the rotated samples to calculate a set of rotated dimensions, and then counter-rotates the rotated dimensions back to the positions of the measured locations to determine the measured set of dimensions of the feature.

    摘要翻译： 用于确定物体的至少一个特征的测量的尺寸集合的探测系统。 系统包括接收至少一个特征的理想的维度集合的输入装置。 所述输入装置产生指示所述至少一个特征取得的样本测量的量和位置的第一信号。 该系统还包括电连接到输入装置的探针装置。 探针装置从输入装置接收第一信号，并且作为响应，将探针引导到所指示的每个样本测量量的每个测量点的位置。 探针装置输出指示所采集的每个样本量的测量位置的第二信号。 该系统还包括与探针装置电连接的处理器。 处理器接收指示所采集的每个样本的测量位置的第二信号，并且围绕单个样本旋转测量的位置，使得所有样本可以被表示为位于二维平面上的点。 此外，处理器使用旋转的样本来计算一组旋转的尺寸，然后将旋转的尺寸反向旋转到测量位置的位置，以确定测量的特征的尺寸集合。