Copper atomic layer chemical vapor desposition
    1.
    发明授权
    Copper atomic layer chemical vapor desposition 有权
    铜原子层化学气相沉积

    公开(公告)号:US06464779B1

    公开(公告)日:2002-10-15

    申请号:US09766143

    申请日:2001-01-19

    IPC分类号: C30B2902

    摘要: This invention pertains to systems and methods for atomic layer chemical vapor deposition. More specifically, the invention pertains to methods for copper atomic layer chemical vapor deposition, particularly to deposit a seed layer prior to the electrochemical Cu fill operation in integrated circuit fabrication. It also pertains to apparatus modules for performing such deposition.

    摘要翻译: 本发明涉及原子层化学气相沉积的系统和方法。 更具体地,本发明涉及铜原子层化学气相沉积的方法,特别是在集成电路制造中的电化学Cu填充操作之前沉积种子层。 它也涉及用于进行这种沉积的装置模块。