公开(公告)号：US06720556B2

公开(公告)日：2004-04-13

申请号：US09847583

申请日：2001-05-03

申请人： Hagai Cohen ,  Israel Rubinstein

发明人： Hagai Cohen ,  Israel Rubinstein

IPC分类号： G01N23227

CPC分类号： G01N23/227 ,  B82Y15/00 ,  H01J2237/2522

摘要： A method of examining a sample, including: performing a first spectroscopic analysis of a surface portion of the sample when the sample surface portion is in a first electrical charge state; placing the sample surface portion in a second electrical charge state that is different from the first electrical charge state and performing a second spectroscopic analysis of the surface portion of the sample when the sample surface portion is in the second electrical charge state; and comparing the first spectroscopic analysis result with the second spectroscopic analysis result to obtain at least one of structural and electrical information about the sample.

摘要翻译： 一种检查样品的方法，包括：当样品表面部分处于第一电荷状态时，对样品的表面部分进行第一光谱分析; 将样品表面部分置于不同于第一电荷状态的第二电荷状态，并且当样品表面部分处于第二电荷状态时，对样品的表面部分进行第二光谱分析; 以及将所述第一光谱分析结果与所述第二光谱分析结果进行比较，以获得关于所述样品的结构和电信息中的至少一个。

公开(公告)号：US06212253B1

公开(公告)日：2001-04-03

申请号：US09266015

申请日：1999-03-11

申请人： Thomas Schedel-Niedrig ,  Axel Knop-Gericke ,  Michael Havecker

发明人： Thomas Schedel-Niedrig ,  Axel Knop-Gericke ,  Michael Havecker

IPC分类号： G01N23227

CPC分类号： G01N23/06

摘要： In order to investigate the reactants involved in a reaction between a gas and a solid by means of X-ray absorption spectroscopy an apparatus is provided which comprises, within a measuring chamber (2), a sample holder (23) for holding a sample (24) of the solid, means for forming an atmosphere of the gas in the measuring chamber under selectable pressure, a window (20) for the entry of X-rays for the irradiation of the sample (24) and a collector arrangement (21, 22) arranged spaced from the sample holder (23), in order to collect in the measuring chamber (2) electrons released by X-ray absorption. The collector arrangement comprises two collector electrodes (21 and 22) which are arranged mutually spaced from one another in sequence lengthwise along the X-ray path between the window (20) and the sample holder (23). Each collector electrode (21, 22) and the sample holder (23) have respective connection means (31, 32, 33) for the connection of each to a respective associated predetermined potential and for the separate measurement of the currents (I1, I2, I3) flowing through these connections. By evaluation of these currents evidentially helpful spectra of the involved reactants can be obtained both at and adjacent to the sample surface and also in the gas phase within the range of soft X-rays.

摘要翻译： 为了通过X射线吸收光谱研究涉及气体和固体之间的反应的反应物，提供了一种在测量室（2）内包括用于保持样品的样品架（23）的装置 24）的固体，用于在可选压力下在测量室中形成气体气氛的装置，用于进入用于照射样品（24）的X射线的窗口（20）和收集器装置（21， 22），其与样品保持器（23）间隔设置，以便在测量室（2）中收集通过X射线吸收释放的电子。 集电器装置包括两个集电极（21和22），它们沿窗口（20）和样品保持器（23）之间的X射线路径沿纵向相互间隔开排列。 每个集电极（21,22）和样品保持器（23）具有各自的连接装置（31,32,33），用于将它们各自连接到相应的相关联的预定电位，并分别测量电流（I1，I2， I3）流经这些连接。 通过评估这些电流，可以在软X射线范围内在样品表面和邻近样品表面以及气相中获得所涉及的反应物的明显有用光谱。

公开(公告)号：US06198097B1

公开(公告)日：2001-03-06

申请号：US09061843

申请日：1998-04-15

申请人： Agostino Abbate ,  Julius Frankel ,  Pankaj K. Das

发明人： Agostino Abbate ,  Julius Frankel ,  Pankaj K. Das

IPC分类号： G01N23227

CPC分类号： G01N21/1717 ,  Y10S977/868

摘要： An apparatus and/or system is described which uses the photocharge voltage concept in lieu of optical scattering techniques to measure surface topology and properties of materials. The system is based on the measurement of a small electrical potential difference which appears on any solid body when subjected to illumination by a modulated laser light. This voltage is proportional to the induced change in the surface electrical charge and is capacitively measured on various materials. The characterization of coatings to be used inside the base of guns is just one possible application for use by the U. S. Army.

摘要翻译： 描述了使用光电荷电压概念代替光散射技术来测量材料的表面拓扑和性质的装置和/或系统。 该系统基于通过调制的激光照射时出现在任何实体上的小电位差的测量。 该电压与表面电荷的感应变化成比例，并且在各种材料上电容测量。 在枪支基地内使用的涂层的表征只是美国陆军使用的一种可能的应用。