Method of forming a self-aligned contact pad for a semiconductor device
    1.
    发明授权
    Method of forming a self-aligned contact pad for a semiconductor device 有权
    形成用于半导体器件的自对准接触焊盘的方法

    公开(公告)号:US06355547B1

    公开(公告)日:2002-03-12

    申请号:US09645968

    申请日:2000-08-24

    IPC分类号: H01L23209

    摘要: A method of manufacturing a self-aligned contact pad for the fabrication of an integrated circuit is disclosed. A plurality of gate structures is formed on the substrate. A first insulating layer is formed over the plurality of gate structures. Then, a second insulating layer is formed over the first insulating layer and filling spaces between the gate structures. Next, a portion of second insulating layer is removed between the gate structures, thereby forming a plurality of contact holes between the gate structures and exposing a portion of the first insulating layer. The exposed portion of the first insulating layer is etched away to form a gate spacer on the sidewalls of the gate structures and exposing surfaces of active regions of the substrate. Finally, the plurality of contact holes are filled with a first conductive layer and the first conductive layer is planarized to form contact pads.

    摘要翻译: 公开了一种用于制造集成电路的自对准接触焊盘的制造方法。 在基板上形成多个栅极结构。 在多个栅极结构上形成第一绝缘层。 然后,在第一绝缘层上形成第二绝缘层,并在栅极结构之间填充空间。 接下来,在栅极结构之间移除第二绝缘层的一部分,从而在栅极结构之间形成多个接触孔,并露出第一绝缘层的一部分。 蚀刻掉第一绝缘层的暴露部分,以在栅极结构的侧壁和衬底的有源区域的暴露表面上形成栅极间隔物。 最后,多个接触孔填充有第一导电层,并且第一导电层被平坦化以形成接触焊盘。