GOLD-FREE OHMIC CONTACTS
    1.
    发明申请
    GOLD-FREE OHMIC CONTACTS 审中-公开
    无黄金联系人

    公开(公告)号:WO2012166385A1

    公开(公告)日:2012-12-06

    申请号:PCT/US2012/038497

    申请日:2012-05-18

    CPC classification number: H01L29/452 H01L29/2003 H01L29/7787

    Abstract: A semiconductor structure is provided having: a semiconductor; a gold-free electrically conductive structure in ohmic contact with the semiconductor; and a pair of electrically conductive layers separated by a layer of silicon. The structure includes: a refractory metal layer disposed in contact with the semiconductor; and wherein one of the pair of electrically conductive layers separated by the layer of silicon is the refractory metal layer. A second layer of silicon is disposed on a second one of the pair of pair of electrically conductive layers and including a third electrically conducive layer on the second layer of silicon. In one embodiment, the semiconductor includes a III-V material.

    Abstract translation: 提供一种半导体结构,其具有:半导体; 与半导体欧姆接触的无金导电结构; 以及一层由硅层隔开的导电层。 该结构包括:与半导体接触设置的难熔金属层; 并且其中由所述硅层分离的所述一对导电层中的一个是难熔金属层。 第二层硅层被设置在一对导电层中的第二层上,并且在第二层硅上包括第三导电层。 在一个实施例中,半导体包括III-V材料。

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