APPARATUS, SYSTEM, AND METHOD FOR PREDICTING FAILURES IN SOLID-STATE STORAGE
    4.
    发明申请
    APPARATUS, SYSTEM, AND METHOD FOR PREDICTING FAILURES IN SOLID-STATE STORAGE 审中-公开
    用于预测固态存储器中的故障的装置,系统和方法

    公开(公告)号:WO2010054410A2

    公开(公告)日:2010-05-14

    申请号:PCT/US2009063938

    申请日:2009-11-10

    Abstract: An apparatus, system, and method are disclosed for predicting failures in solid-state storage and include a determination module (302), a threshold module (304), a storage region error module (306), and a retirement module (308). The determination module (302) determines that data stored in an ECC chunk contains Error Correcting Code ("ECC") correctable errors and further determines a bit error count for the ECC chunk. The ECC chunk originates from non-volatile solid-state storage media (110). The threshold module (304) determines that the bit error count satisfies an ECC chunk error threshold. The storage region error module (306) determines that a storage region that contained contains at least a portion of the ECC chunk satisfies a region retirement criteria. The retirement module (310) retires the storage region that contains at least a portion of the ECC chunk where the storage region satisfies the region retirement criteria.

    Abstract translation: 公开了一种用于预测固态存储器中的故障的设备,系统和方法,并且包括确定模块(302),阈值模块(304),存储区域错误模块(306)和引退模块(308)。 确定模块(302)确定存储在ECC块中的数据包含纠错码(“ECC”)可校正错误,并进一步确定ECC块的位错误计数。 ECC块源自非易失性固态存储介质(110)。 阈值模块(304)确定比特错误计数满足ECC块错误阈值。 存储区域错误模块(306)确定所包含的存储区域包含ECC组块的至少一部分满足区域引退标准。 退休模块(310)退还包含存储区域满足区域退役标准的ECC组块的至少一部分的存储区域。

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