Abstract:
A semiconductor device transfer system used in a semiconductor tester of a tray-magazine type, which comprises a semiconductor device conveyor and a device for changing the attitude of devices being conveyed. The semiconductor devices are loaded into a horizontal testing tray from a magazine which is supported obliquely to feed them by gravity. The inclined semiconductor devices from the magazine are turned to be horizontal by means of a rail extending gently downward and ending in horizontal state, or a movable rail which rotates in a horizontal direction after receiving inclined semiconductor devices, or a rotary arm which holds inclined semiconductor devices and puts them in horizontal state while turning 180 DEG .