公开(公告)号：WO0235249A3

公开(公告)日：2002-07-18

申请号：PCT/US0132626

申请日：2001-10-24

Applicant: MITSUBISHI ELECTRONICS AMERICA ,  ORBAN RICHARD

Inventor： ORBAN RICHARD

IPC: G01R31/311

CPC classification number: G01R31/311

Abstract: A circuit is tested for latch-up by scanning an optical beam across the surface, supplying power to the integrated circuit, monitoring the power of the power supply, and detecting latch-up in the integrated circuit by capturing an image of the integrated circuit when the power reaches a predetermined threshold. The captured image is compared with a baseline image to determine where latch-up occurs in the circuit.

Abstract translation: 通过在表面上扫描光束来测试电路的闩锁，向集成电路供电，监控电源的功率，以及通过捕获集成电路的图像来检测集成电路的闩锁，当捕获集成电路的图像时 功率达到预定阈值。 拍摄的图像与基线图像进行比较，以确定电路中闩锁发生的位置。