公开(公告)号：WO2010147598A1

公开(公告)日：2010-12-23

申请号：PCT/US2009/048010

申请日：2009-06-19

Applicant: DOLPHIN MEASUREMENT SYSTEMS, LLC ,  RAYKHMAN, Alexander, M. ,  NAIDIS, Eugene ,  WALDMAN, Ellis, S.

Inventor： RAYKHMAN, Alexander, M. ,  NAIDIS, Eugene ,  WALDMAN, Ellis, S.

IPC: G01R29/08 ,  G01R27/02 ,  G02B27/00

CPC classification number: G01B7/023 ,  B21B38/04 ,  G01B7/107

Abstract: A system and method for measurement of parameters of a conductive material, include generating an oscillating electromagnetic field (EMF) interacting with a sample portion from a remotely positioned source; measuring values of components of impedance of the electromagnetic; populating a system of equations including a theory of electromagnetism- based mathematical model of the electromagnetic system; solving the system of equations to calculate values of a distance between the sample portion and the source, thickness of the sample portion in proximity to a point of projection of the source onto the sample portion and electromagnetic properties of the sample portion; outputting the calculated values as the measured values; and repeating the steps of generating, populating, solving, outputting and repeating using the calculated values for the step of populating in place of the measured component values.

Abstract translation: 一种用于测量导电材料的参数的系统和方法，包括产生与来自远程位置的源相互作用的振荡电磁场（EMF）; 测量电磁阻抗分量值; 包括电磁系统的基于电磁学的数学模型理论的方程组; 求解方程式来计算样品部分和源之间的距离值，样品部分的厚度接近源到样品部分的投影点和样品部分的电磁特性; 输出计算值作为测量值; 并且使用用于填充的步骤的计算值来代替所测量的分量值来重复生成，填充，解决，输出和重复的步骤。

公开(公告)号：WO2018175995A1

公开(公告)日：2018-09-27

申请号：PCT/US2018/024192

申请日：2018-03-23

Applicant: DOLPHIN MEASUREMENT SYSTEMS, LLC ,  WALDMAN, Ellis, S. ,  RAYKHMAN, Alexander, M. ,  SHERMAN, Boris

Inventor： WALDMAN, Ellis, S. ,  RAYKHMAN, Alexander, M. ,  SHERMAN, Boris

IPC: G01B15/02 ,  G01B7/06 ,  G01S11/02 ,  G01S13/58 ,  G01S13/76

CPC classification number: G01B15/02 ,  G01B2210/44 ,  G01S11/02 ,  G01S13/10 ,  G01S13/581 ,  G01S13/87 ,  G01S13/88

Abstract: An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the radar-generated electromagnetic wave and each surface of a flat sheet material is used to determine the thickness of that material as a relative distance. A pair of high frequency radars situated at different locations used to measure the delay time between the occurrences of fingerprint-like unevenness on the moving flat sheet of material to determine the linear velocity of the moving material sheet.