公开(公告)号：WO0194955A3

公开(公告)日：2002-04-18

申请号：PCT/US0140909

申请日：2001-06-08

Applicant: UNIV MICHIGAN ,  WHITAKER JOHN N FA ,  YANG KYOUNG ,  KATEHI LINDA P B

Inventor： WHITAKER JOHN FIRMAN ,  YANG KYOUNG ,  KATEHI LINDA P B

IPC: G01R1/07 ,  G01R13/34 ,  G01R29/08 ,  G01R29/14 ,  G01R31/311

CPC classification number: G01R29/14 ,  G01R1/071 ,  G01R13/347 ,  G01R29/0885 ,  G01R31/311

Abstract: A microwave and millimeter-wave electric-field mapping system based on electro-optic sampling has been developed using micromachined Gallium Arsenide crystals mounted on gradient index lenses and single-mode optical fibers. The probes are able to detect three orthogonal polarizations of electric fields and, due to the flexibility and size of the optical fiber, can be positioned not only from the extreme near-field to the far-field regions of microwave and millimeter-wave structures, but also inside of enclosures such as waveguides and packages. A microwave electric-field-mapping system based on micromachined GaAs electro-optic sampling probes mounted on gradient index lenses and single-mode optical fibers can extract field images from the interior of an enclosed microwave cavity.

Abstract translation: 已经使用安装在梯度折射率透镜和单模光纤上的微加工砷化镓晶体开发了基于电光采样的微波和毫米波电场映射系统。 探头能够检测电场的三个正交极化，并且由于光纤的灵活性和尺寸，不仅可以定位在微波和毫米波结构的远场区域的极端近场， 而且还在诸如波导和封装的外壳内部。 基于安装在梯度折射率透镜和单模光纤上的微加工GaAs电光采样探针的微波电场映射系统可以从封闭的微波腔内部提取场图像。