Abstract:
An imaging optics (7) has a plurality of mirrors (M1 to M6), which image an object field (4) in an object plane (5) in an image field (8) in an image plane (9). A pupil plane (17) is arranged in the imaging beam path between the object field (4) and the image field (8). A stop (20) is arranged in the pupil plane (17). The pupil plane (17) is tilted, in other words adopts an angle (α) with respect to the object plane (5), which is greater than 0.1°. An imaging optics results, with which a handleable combination of small imaging errors, manageable production and good throughput for the imaging light is achieved.
Abstract:
Die Erfindung betrifft eine optische Vorrichtung (10) mit verbessertem Abbildungsverhalten sowie ein Verfahren zum Verbessern des Abbildungsverhaltens der optischen Vorrichtung (10). Die optische Vorrichtung (10) weist eine Mehrzahl an optischen Elementen (28a-d) entlang einer Lichtausbreitungsrichtung der optischen Vorrichtung (10) zum Abbilden einer Struktur (20) in einer Objektebene (O) der optischen Vorrichtung (10) auf ein Substrat (22) in einer Bildebene (B) der optischen Vorrichtung (10) auf. Die optische Vorrichtung (10) weist im Kaltzustand zumindest einen ersten Abbildungsfehler auf, der einen zumindest zweiten, während des Betriebs durch Erwärmen zumindest eines der optischen Elemente (28a-d) verursachten Abbildungsfehler der optischen Vorrichtung (10) zumindest teilweise kompensiert.
Abstract:
The invention features a system for microlithography that includes a mercury light source configured to emit radiation at multiple mercury emission lines, a projection objective positioned to receive radiation emitted by the mercury light source, and a stage configured to position a wafer relative to the projection objective. During operation, the projection objective directs radiation from the light source to the wafer, where the radiation at the wafer includes energy from more than one of the emission lines. Optical lens systems for use in said projection objective comprise four lens groups, each having two lenses comprising silica, the first and second lens groups on one hand and the third and fourth lens groups on the other hand are positioned symmetrically with respect to a plane perpendicular to the optical axis of said lens system.
Abstract:
Es wird bereitgestellt ein Okularsystem zum Abbilden eines Objektes als virtuelles Bild, mit einer Relayoptik (4), die eine Linse (6) und einen Umlenkspiegel (7) aufweist, und einem drei optische Flächen (8, 9, 10) aufweisenden Prisma (5), das der Relayoptik (4) so nachgeordnet ist, daß zur Abbildung der Strahlengang vom Objekt (2) zur Relayoptik (4) und von dort über die erste optische Fläche (8) in das Prisma (5) eintritt, durch Reflexionen an der zweiten und dritten optischen Fläche (9, 10) im Prisma (5) genau zweimal gefaltet ist und über die zweite Fläche (9) aus dem Prisma (5) austritt und bis zur Austrittspupille (3) des Okularsystems (1) verläuft, wobei der Strahlengang in der Relayoptik (4) durch den Umlenkspiegel (7) genau einmal gefaltet ist und somit zweimal durch die Linse (6) geht.
Abstract:
An imaging optical system has a plurality of mirrors, which image an object field (9) in an object plane (11) into an image field (13) in an image plane (14). A reflection face of at least one of the mirrors is configured as a free form face which cannot be described by a rotationally symmetrical function. The object field has an aspect ratio (x/y), which is greater than 1, a ratio of a minimal and a maximal transverse dimension of the object field being smaller than 0.9. In a further aspect, the object field (9) and/or the image field (13) deviate from a mirror-symmetrical field form. An illumination optical system (10) for illuminating the object field (9) has components guiding illumination light (3) which are designed to illuminate a correspondingly formed object field (9). The result is an imaging optical system, an illumination optical system and a projection exposure system equipped therewith, with which increased demands on the correction of imaging errors are taken into account over the field imaged by the imaging optical system.
Abstract:
An imaging optical system (31) with a plurality of mirrors (Ml to M6), which image an object field (4) in an object plane (5) into an image field (8) in an image plane (9), according to either one of the following configurations : a) a connecting axis (32), which is perpendicular to the object plane (5) and runs through the geometric centre point of the mirror (M2), which is spatially most closely adjacent to the object field (4), the mirror (M2) most closely adjacent to the object field (4), is arranged at a spacing (A) from the object field (4), which is greater than a spacing (B) of an entry pupil plane (30) of the imaging optical system (31), said pupil plane (30) lying in the beam path of the imaging light (3) upstream of the object field (4), from the object field (4); b) - with an entry pupil plane (30), which lies in the beam path of the imaging light (30) upstream of the object field (4), wherein the imaging light (3) is reflected on the object plane (5), - with a connecting axis (32) which is perpendicular to the object plane (5) and runs through the geometric centre point of the entry pupil, - wherein an intersection point (C) of the connecting axis (32) with the entry pupil plane (30) is closer to the object plane (5) than a first intersection point (D) in the beam path of the imaging light (3) downstream of the object field (4), of a main beam (33) of a central object field point with the connecting axis (32), - wherein at least one of the mirrors (M5, M6) has a through-opening (18, 19) for imaging light (3) to pass through; c) the imaging optical system (7; 31), spaced apart from a first mirror (M5), which is most closely adjacent to one of the two fields (4, 8) and is designated a neighbouring mirror, has a deformable further mirror (M3), which is arranged in a plane, which is optically conjugated to an arrangement plane of the neighbouring mirror (M5) in the imaging optical system (7; 31); d) a support body (21) of a mirror (M5), which is most closely adjacent to one of the two fields (4, 8), of the neighbouring mirror, is made of a material, the modulus of elasticity of which is at least twice as great as the modulus of elasticity of the material of the support body (22) of at least one of the other mirrors (M 1 to M4, M6).
Abstract:
The invention relates to a projection exposure apparatus (16) for semiconductor lithography comprising a device for the thermal manipulation of an optical element (1,100), wherein the optical element (1,100) has a front side (2) for the reflection of electromagnetic radiation and a rear side (3,103), and wherein thermal actuators (4) for influencing the optical properties of the optical element (1,100) are present, which act on the optical element (1,100) from the rear side (3,103) thereof.
Abstract:
A projection objective (7) for microlithography is used for imaging an object field (4) in an object plane (5) into an image field (8) in an image plane (9). The projection objective (7) comprises at least six mirrors (M1 to M6) of which at least one mirror has a freeform reflecting surface. According to one aspect of the invention, the ratio between an overall length (T) of the projection objective (7) and an object image shift (d OIS ) is smaller than 12. According to another aspect of the invention, the image plane (9) is the first field plane of the projection objective (7) downstream of the object plane (5). According to another aspect of the invention, the projection objective has a plurality of mirrors (M1 to M6), wherein the ratio between an overall length (T) and an object image shift (d OIS ) is smaller than 2.
Abstract:
A projection objective of a microlithographic projection exposure apparatus comprises a wavefront correction device (42) comprising a refractive optical element (44; 44a, 44b) that has two opposite optical surfaces (46, 48), through which projection light passes, and a circumferential rim surface (50) extending between the two optical surfaces (46, 48). A first and a second optical system (OS1, OS2) are configured to direct first and second heating light (HL1, HL2) to different portions of the rim surface (50) such that at least a portion of the first and second heating light enters the refractive optical element (44; 44a, 44b). A temperature distribution caused by a partial absorption of the heating light (HL1, HL2) results in a refractive index distribution inside the refractive optical element (44; 44a, 44b) that corrects a wavefront error. At least the first optical system (OS1) comprises a focusing optical element (55) that focuses the first heating light in a focal area (56) such that the first heating light emerging from the focal area (56) impinges on the rim surface (50).