公开(公告)号：WO2022104080A1

公开(公告)日：2022-05-19

申请号：PCT/US2021/059169

申请日：2021-11-12

Applicant: ARGO AI, LLC

Inventor： WAGNER, Morgan M. ,  LAVERNE, Michel H.J. ,  STEWART, Nikolas ,  SENNOTT, Casey J. ,  LENKIN, Lawrence Steven

IPC: G01M11/02 ,  G01M11/08

Abstract: Devices, systems, and methods are provided for optical device validation. For example, a system may comprise an optical device operable to emit or absorb light, wherein the optical device comprises a lens having an outer surface. The system may comprise a camera positioned in a line of sight of the optical device, wherein the camera is operable to capture one or more images of the optical device. The system may comprise a computer system in communication with to the camera and operable to calculate a validation score for a captured image of the one or more images and to validate the optical device based on a validation state generated using the calculated validation score.

公开(公告)号：WO2022032164A1

公开(公告)日：2022-02-10

申请号：PCT/US2021/045059

申请日：2021-08-06

Applicant: ARGO AI, LLC

Inventor： SENNOTT, Casey J. ,  WAGNER, Morgan M. ,  YAUTZ, Dustin Ryan

IPC: G01S7/497 ,  G01S7/481 ,  G01S17/931 ,  B60S1/56 ,  B60Q11/00 ,  B60S1/46 ,  B60S1/54 ,  B60W2050/0215 ,  B60W2556/20 ,  B60W2556/25 ,  B60W50/0205 ,  B60W50/04

Abstract: Devices, systems, and methods are provided for enhanced sensor cleaning validation. A device may determine a baseline performance measurement associated with a clean performance baseline of a sensor. The device may actuate a cleaning mechanism to remove at least a portion of an obstruction deposited on the sensor. The device may determine a first post-clean performance measurement associated with the sensor. The device may determine a degradation measurement between the baseline performance measurement and the first post-clean performance measurement, wherein the degradation measurement indicates an effectiveness of the cleaning mechanism.

公开(公告)号：WO2022020499A1

公开(公告)日：2022-01-27

申请号：PCT/US2021/042615

申请日：2021-07-21

Applicant: ARGO AI, LLC

Inventor： SENNOTT, Casey J.

IPC: G01B21/32 ,  G01B21/22 ,  G01D21/02 ,  G01C3/02 ,  G01S13/86 ,  G01S13/931 ,  G01S17/931 ,  G01J5/20

Abstract: Devices, systems, and methods are provided for enhanced sensor alignment. A device may determine a first array of displacement sensors proximate to a first test structure. The device may determine a second array of displacement sensors proximate to a second test structure. The device may apply a test condition to the first array, the second array, the first test structure, and the second test structure. The device may collect a first output from applying the test condition to the first test structure. The device may collect a second output from applying the test condition to the second test structure. The device may generate a first deviation vector associated with the first output. The device may generate a second deviation vector associated with the second output. The device may determine a first design status of the first structure based on the first deviation vector. The device may determine a second design status of the second structure based on the second deviation vector.