公开(公告)号：WO2017131636A1

公开(公告)日：2017-08-03

申请号：PCT/US2016/014909

申请日：2016-01-26

Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP

Inventor： KAPOOR, Mark Vinod ,  MCAFEE, Martin Elmore ,  WIENCHOL, Hermann

IPC: G11C13/00 ,  G11C29/04

CPC classification number: G06F11/2236 ,  G01R31/2813 ,  G01R31/2818 ,  G01R31/2851 ,  G11C13/0004 ,  G11C13/0007 ,  G11C2029/4402

Abstract: Methods and apparatus to store fault data and/or status data associated with an integrated circuit (100) into a memristor system (106) are disclosed. An example method includes determining when a fault corresponding to an integrated circuit (100) has occurred, when first data related to the integrated circuit (100) is updated. An example method further includes storing the first data in a first subset of a plurality of resistive elements. An example method further includes, in response to the detection of the fault, storing second data in a second subset of the plurality of resistive elements, the second data corresponding to an error associated with the fault.

Abstract translation: 公开了用于将与集成电路（100）相关联的故障数据和/或状态数据存储到忆阻器系统（106）中的方法和设备。 示例方法包括确定何时发生与集成电路（100）相对应的故障，何时更新与集成电路（100）相关的第一数据。 示例方法还包括将第一数据存储在多个电阻元件的第一子集中。 示例性方法还包括响应于检测到故障，将第二数据存储在多个电阻元件的第二子集中，第二数据对应于与故障相关的误差。