公开(公告)号：WO2017131636A1

公开(公告)日：2017-08-03

申请号：PCT/US2016/014909

申请日：2016-01-26

Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP

Inventor： KAPOOR, Mark Vinod ,  MCAFEE, Martin Elmore ,  WIENCHOL, Hermann

IPC: G11C13/00 ,  G11C29/04

CPC classification number: G06F11/2236 ,  G01R31/2813 ,  G01R31/2818 ,  G01R31/2851 ,  G11C13/0004 ,  G11C13/0007 ,  G11C2029/4402

Abstract: Methods and apparatus to store fault data and/or status data associated with an integrated circuit (100) into a memristor system (106) are disclosed. An example method includes determining when a fault corresponding to an integrated circuit (100) has occurred, when first data related to the integrated circuit (100) is updated. An example method further includes storing the first data in a first subset of a plurality of resistive elements. An example method further includes, in response to the detection of the fault, storing second data in a second subset of the plurality of resistive elements, the second data corresponding to an error associated with the fault.

Abstract translation: 公开了用于将与集成电路（100）相关联的故障数据和/或状态数据存储到忆阻器系统（106）中的方法和设备。 示例方法包括确定何时发生与集成电路（100）相对应的故障，何时更新与集成电路（100）相关的第一数据。 示例方法还包括将第一数据存储在多个电阻元件的第一子集中。 示例性方法还包括响应于检测到故障，将第二数据存储在多个电阻元件的第二子集中，第二数据对应于与故障相关的误差。

公开(公告)号：WO2017007454A1

公开(公告)日：2017-01-12

申请号：PCT/US2015/039348

申请日：2015-07-07

Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP

Inventor： KAPOOR, Mark V. ,  MCAFEE, Martin E. ,  WIENCHOL, Hermann

IPC: G01R23/12 ,  G01R19/252

CPC classification number: G06F1/26

Abstract: Example implementations relate to phase shedding. For example, phase shedding can include receiving performance and active status information associated with each of a plurality of phases within a system and systematically shedding a phase from within the plurality of phases based on the received information.

Abstract translation: 示例实现涉及相位脱落。 例如，相位脱落可以包括接收与系统内的多个相位中的每一个相关联的性能和活动状态信息，并且基于接收到的信息系统地从多个阶段中切出相位。