Abstract:
Methods, devices, and systems for determining failure of an ultraviolet (UV) sensor are described herein. One device includes a memory, and a processor configured to execute executable instructions stored in the memory to reduce an excitation voltage of a UV sensor until no conduction occurs in the UV sensor, increase, upon no conduction occurring in the UV sensor, the excitation voltage of the UV sensor until a conduction event occurs, compare the excitation voltage at which the conduction event occurs to a reference voltage, and determine whether the UV sensor has failed based on the comparison.
Abstract:
Utilizing a quench time to deionize an ultraviolet (UV) sensor tube are described herein. One method includes monitoring firing events within a UV sensor tube, where a particular firing event initiates arming the UV sensor tube, initiating a quench time to deionize the UV sensor tube, where the quench time includes, disarming the UV sensor tube to prevent a firing event.
Abstract:
A programmable controller for controlling an ultraviolet (UV) sensor may adjust an excitation voltage provided to the UV sensor based at least in part on a programmable sensitivity offset in order to produce an excitation voltage that results in a desired UV sensitivity for the UV sensor. The programmable sensitivity offset may be set for the UV sensor at the factory, set during commissioning of the UV sensor in the field, and/or automatically altered over time to help compensate for a degradation in sensitivity of the UV sensor.