TEST OF SEMICONDUCTOR STORAGE POWER CONSUMPTION ON BASIS OF EXECUTED ACCESS COMMANDS
    1.
    发明申请
    TEST OF SEMICONDUCTOR STORAGE POWER CONSUMPTION ON BASIS OF EXECUTED ACCESS COMMANDS 审中-公开
    基于执行访问命令的半导体存储功耗测试

    公开(公告)号:WO2016073388A1

    公开(公告)日:2016-05-12

    申请号:PCT/US2015/058695

    申请日:2015-11-03

    Abstract: The present invention extends to methods, systems, and computer program products for testing storage device power circuitry (113). A storage device controller (102) includes an embedded test program (104). The storage device controller executes the test program in response to receiving a test command. In one aspect, the test program issues a plurality of different command patterns (107A,..., 107C) to test shared power circuitry (113) of storage device components (e.g., shared by an array of NAND flash memory devices (108A,..., 108C)). The test program identifies a command pattern (107) that causes a greatest total current draw. In another aspect, the test program issues a specified command pattern (possibly repeatedly) to shared power circuitry to determine if the shared power circuitry fails.

    Abstract translation: 本发明扩展到用于测试存储设备电源电路(113)的方法,系统和计算机程序产品。 存储设备控制器(102)包括嵌入式测试程序(104)。 响应于接收到测试命令,存储设备控制器执行测试程序。 在一个方面,测试程序发布多个不同的命令模式(107A,...,107C),以测试存储设备组件的共享电源电路(113)(例如,由NAND闪存设备阵列(108A, ...,108C))。 测试程序识别导致最大总电流消耗的命令模式(107)。 在另一方面,测试程序向共享的电源电路发出指定的指令模式(可能重复),以确定共享电源电路是否发生故障。

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