摘要:
A method of encoding data on single level or variable multi-level cell storage includes receiving a block of encoded data from an approximation-aware application and at least an importance attribute associated with the block of encoded data; and assigning the block of encoded data to a memory address or a particular region of a memory having at least three precision levels, based at least according to the importance attribute. The importance attribute indicates a relative sensitivity of bits of the block to errors in an output quality from decoding the encoded data. An approximation-aware application can be an image encoding application having a modified entropy encoding step that enables identification and splitting of bits into groupings according to sensitivity to errors.
摘要:
An apparatuses and methods for buffering a voltage from a circuit without current drive ability are described. An example apparatus includes a voltage buffer that includes two identical stages. The first stage is configured to receive an input voltage and produce an intermediate voltage as an output. The second stage is configured to receive the intermediate voltage and provide an output voltage that is equal to the input voltage. The voltage buffer may be coupled to a current source. The second stage of the voltage buffer may have current drive ability.
摘要:
A data storage device includes a controller coupled to a non-volatile memory. The non-volatile memory is configured to store multiple tags that include a first tag and a second tag. The controller is configured to determine one or more candidate values associated with a candidate tag. The one or more candidate values may be determined based on an operation applied to the first tag and the second tag. The controller is further be configured to cause the non-volatile memory to remove the first tag or the second tag from the multiple tags.
摘要:
An apparatus may include a processor circuit a processor circuit to retrieve data from a non-volatile memory, and a multistrobe read module operable on the processor circuit to set a read operation to read a memory cell over a multiplicity of sense operations, where each sense operation is performed under a different sense condition. The multistrobe read module may be further operable to schedule a new sense operation to succeed a prior sense operation of the multiplicity of sense operations without recharge of the wordline when a value of one or more read condition is within a preset range. Other embodiments are disclosed and claimed.
摘要:
A method for operating a memory (36) includes storing data in a plurality of analog memory cells (40) that are fabricated on a first semiconductor die by writing input storage values to a group of the analog memory cells After storing the data, multiple output storage values are read from each of the analog memory cells in the group using respective, different threshold sets of read thresholds, thus providing multiple output sets of the output storage values corresponding respectively to the threshold sets The multiple output sets of the output storage values are preprocessed by circuitry (48) that is fabricated on the first semiconductor die, to produce preprocessed data Preprocessed data is provided to a memory controller (28), which is fabricated on a second semiconductor die that is different from the first semiconductor die, so as to enable the memory controller to reconstruct the data responsively to the preprocessed data
摘要:
Self-calibration for a memory controller is performed by writing a voltage to a selected cell. Adjacent cells around the selected cell are programmed. After each of the adjacent programming operations, the voltage on the selected cell is read to determine any change in voltage caused by systemic offsets such as, for example, floating gate-to-floating gate coupling. These changes are averaged and stored in a table as an offset for use in adjusting a programming voltage or a read voltage in a particular area of memory represented by the offset. Self calibration method for temperature is determined by writing cells at different temperatures and reading at different temperatures to generate temperature offset tables for the write path and read path. These offset tables are used to adjust for systematic temperature related offsets during programming and during read.
摘要:
A semiconductor memory (301) comprises a first capacitor for storing digital data connecting a cell plate line (PLn) to a first bit-line (BLno) through a first select transistor. The first select transistor is activated through a connection to a word line (WLn). Two reference capacitors (301, 309) provide an averaging reference voltage to a reference bit-line. A sense amplifier (109, 305) connected to the first and reference bit-lines (BLno, BLro) measures a differential read signal on the first and reference bit-lines. A toggle flip flop alternately changes the polarization of charge stored on the reference capacitors.
摘要:
A test circuit for testing differential read signals during a memory access is disclosed. The test circuit is coupled to a pair of bitlines. During a read access, a selected memory cell produces a differential read signal on the bitlines. When the test circuit is activated, the magnitude of the differential read signal is varied. This enables easy testing of read signal margins in, for example, memory ICs.
摘要:
A data storage device includes a solid-state memory including memory cells and a controller that performs a first programming scheme that programs a first subset of the cells to a first voltage state using a first target voltage, programs a second subset to a second voltage state using a second target voltage higher than the first target voltage, programs a third subset to a third voltage state using a third target voltage higher than the second target voltage, and programs a fourth subset to a fourth voltage state using a fourth target voltage higher than the third target voltage. A difference in voltage between the fourth target voltage and the third target voltage may be greater or less than a difference in voltage between the third target voltage and the second target voltage and/or a difference in voltage between the second target voltage and the first target voltage.
摘要:
Techniques for assigning error rates to memory are described. In one aspect, an indication of physically addressable memory in a system is received. The indication may include available error rates and a range granularity for assigning error rates to ranges of the physically addressable memory. Error rates may be assigned to each range of the physically addressable memory.