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公开(公告)号：WO2017185069A1
公开(公告)日：2017-10-26
申请号：PCT/US2017/029006
申请日：2017-04-21
摘要： System and method for optical drift correction uses light from a light source that is reflected from a curved surface of a mirror and detected at photosensitive detectors to detect movements of the mirror with respect to the light source.
摘要翻译： 用于光学漂移校正的系统和方法使用来自光源的光，该光源从镜子的曲面反射并且在光敏检测器处被检测以检测镜子相对于光源的移动。 / p>
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2.发明申请
公开(公告)号：WO2021127274A1
公开(公告)日：2021-06-24
申请号：PCT/US2020/065748
申请日：2020-12-17
摘要： A scanning probe microscope and method for resonance-enhanced detection using the scanning probe microscope uses a light source that is modulated in a range of frequencies to irradiate an interface between a probe tip of the microscope and a sample with modulated electromagnetic radiation from the light source. The vibrational response of the driven cantilever in response to the modulated electromagnetic radiation at the interface between the probe tip and the sample is then detected. The amplitude of the vibrational response of the cantilever over the entire range of modulation frequencies is measured to derive a photo-induced force microscope (PiFM) value.
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3.发明申请
公开(公告)号：WO2019227078A1
公开(公告)日：2019-11-28
申请号：PCT/US2019/034058
申请日：2019-05-24
摘要： A scanning probe microscope and method of operating the microscope uses a resonant material between a metallic probe tip and a surface of a sample with at least one material having a dielectric constant ε. When electromagnetic radiation from a light source is transmitted to an interface between the metallic probe tip and the sample, absorption of the electromagnetic radiation by the resonant sensor material that is dependent on the dielectric constant of the at least one material of the sample is detected.
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